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A fast coherent synchrotron radiation monitor for the bunch length of the short CEBAF bunches

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.50289· OSTI ID:288374
; ;  [1]; ; ;  [2]
  1. CEBAF, 12000 Jefferson Ave., Newport News, Virginia 23606 (United States)
  2. Semiconductor Research Laboratory, Univ. of Virginia, Charlottesville, Virginia (United States)
A novel bunch length monitor for short (down to subpicosecond) electron bunches has been developed in a collaboration between CEBAF and the University of Virginia (UVA), using coherent synchrotron radiation (CSR) detection techniques. The monitor employs a state of the art {open_quote}{open_quote}narrowband{close_quote}{close_quote} GaAs Schottky whisker diode developed by the UVA group, and has the following features: it is non-invasive, compact, and low cost, it has fast rise time, low noise, high sensitivity, and it operates at room temperature. In this paper, the design parameters and performance of the monitor and selected measurement results will be presented. {copyright} {ital 1996 American Institute of Physics.}
Research Organization:
Thomas Jefferson National Accelerator Facility
DOE Contract Number:
AC05-84ER40150
OSTI ID:
288374
Report Number(s):
CONF-9509227--
Journal Information:
AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 367; ISSN APCPCS; ISSN 0094-243X
Country of Publication:
United States
Language:
English

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