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Correcting {ital M}{sub 56} and {ital T}{sub 566} to obtain very short bunches at CEBAF

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.50330· OSTI ID:288330
 [1]
  1. Continuous Electron Beam Accelerator Facility, 12000 Jefferson Avenue, Newport News, Virginia 23606 (United States)
One primary determinant of the quality of the final CEBAF beam is the length of the accelerated bunches. Therefore, many studies on the bunch length have been completed over the years at CEBAF, using both computer simulations and experiment. The main goals of the effort were to quantify the smallest bunch length that could be obtained with the injector and to develop operational settings for the injector. By examining the evolution and distortion of the longitudinal phase space as bunching occurs, it becomes clear that the bunch length is minimized not only when the phase space distribution is oriented without slope (i.e. there is a longitudinal focus and {sigma}{sub 56} is zero), but also when some of the non-linearity in the bunching force is systematically corrected by a suitable phasing of the RF cavities producing the bunching. Settings with this property have been established in the CEBAF injector and have yielded phase transfer measurements in beautiful agreement with the calculations. The measurements are clearly precise enough to allow the first-order non-linearity to be corrected. A bunch length of 0.35{degree} (at 1497 MHz) has been obtained for low currents at CEBAF. The compression ratio is about 200 in the {open_quote}{open_quote}best{close_quote}{close_quote} case and the bunch length is 200 {mu}m (650 fsec.) {copyright} {ital 1996 American Institute of Physics.}
Research Organization:
Thomas Jefferson National Accelerator Facility
Sponsoring Organization:
USDOE
DOE Contract Number:
AC05-84ER40150
OSTI ID:
288330
Report Number(s):
CONF-9509227; CEBAF-PR-95-79
Journal Information:
AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 367; ISSN APCPCS; ISSN 0094-243X
Country of Publication:
United States
Language:
English

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