A noninvasive bunch length monitor for femtosecond electron bunches
- Thomas Jefferson National Accelerator Facility, Newport News, Virginia 23606 (United States)
- Semiconductor Device Laboratory, University of Virginia, Charlottesville, Virginia 22903 (United States)
A bunch length monitor for ultrashort (90 fs to 1 ps) electron bunches using a coherent synchrotron radiation detection techniques has been developed in a collaboration between the Thomas Jefferson National accelerator Facility (Jefferson Lab) and the University of Virginia. The noninvasive, high-resolution, high-sensitivity, low-noise monitor employs a state-of-the-art {open_quotes}bandpass{close_quotes} GaAs Schottky whisker diode operated at room temperature. This letter presents the monitor{close_quote}s performance. {copyright} {ital 1997 American Institute of Physics.}
- Research Organization:
- Thomas Jefferson National Accelerator Facility
- DOE Contract Number:
- AC05-84ER40150
- OSTI ID:
- 489252
- Journal Information:
- Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 4 Vol. 70; ISSN 0003-6951; ISSN APPLAB
- Country of Publication:
- United States
- Language:
- English
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