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Reliability of Wide-Bandgap Power Electronics: Devices to Systems

Conference ·
DOI:https://doi.org/10.2172/2585807· OSTI ID:2585807
 [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1]
  1. Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
+ Show Author Affiliations
Research Organization:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
DOE Contract Number:
NA0003525
OSTI ID:
2585807
Report Number(s):
SAND2024-10046C; 1752949
Country of Publication:
United States
Language:
English

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