Reliability Studies of Wide-Bandgap Power Semiconductor Devices Under Realistic Stress Conditions.

Conference · Tue Sep 01 00:00:00 EDT 2020

OSTI ID:1821084

Kaplar, Robert; Flicker, Jack David; Slobodyan, Oleksiy; Mueller, Jacob; Garcia Rodriguez, Luciano Andres; Binder, Andrew; Dickerson, Jeramy Ray; Smith, Trevor; Atcitty, Stanley

Abstract not provided.

• Research Organization: Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
• Sponsoring Organization: USDOE Office of Electricity Delivery and Energy Reliability (OE)
• DOE Contract Number: NA0003525
• OSTI ID: 1821084
• Report Number(s): SAND2020-9584PE; 690523
• Country of Publication: United States
• Language: English