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Method of chemical doping that uses CMOS-compatible processes

Patent ·
OSTI ID:2293772
A method of Atomic Precision Advanced Manufacturing (APAM) is provided, in which a substrate is doped from a dopant precursor gas. The method involves covering a surface of the substrate with a hard mask, selectively removing material from the hard mask such that selected areas of the substrate surface are laid bare, exposing the laid-bare areas to the dopant precursor gas, and heating the substrate so as to incorporate dopant from the dopant precursor gas into the substrate surface.
Research Organization:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
DOE Contract Number:
NA0003525
Assignee:
National Technology & Engineering Solutions of Sandia, LLC (Albuquerque, NM)
Patent Number(s):
11,798,808
Application Number:
17/360,284
OSTI ID:
2293772
Country of Publication:
United States
Language:
English

References (13)

All-optical lithography process for contacting nanometer precision donor devices journal November 2017
Spin read-out in atomic qubits in an all-epitaxial three-dimensional transistor journal January 2019
Photothermal alternative to device fabrication using atomic precision advanced manufacturing techniques conference March 2020
Atomically Precise Placement of Single Dopants in Si journal September 2003
Single-Shot Spin Readout in Semiconductors Near the Shot-Noise Sensitivity Limit journal October 2019
A two-qubit gate between phosphorus donor electrons in silicon journal July 2019
CMOS Compatible Atomic-Precision Donor Devices journal May 2020
Low-Temperature Silicon Epitaxy for Atomic Precision Devices journal October 2019
A single-atom transistor journal February 2012
CMOS platform for atomic-scale device fabrication journal August 2018
Atomic Precision Advanced Manufacturing for Digital Electronics journal February 2020
Atomic-Scale Desorption Through Electronic and Vibrational Excitation Mechanisms journal June 1995
Measurement of phosphorus segregation in silicon at the atomic scale using scanning tunneling microscopy journal August 2004

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