Exchange Spring in a Heterostructure with Pd{sub 0.96}Fe{sub 0.04} Low-Temperature Ferromagnet

Journal Article · Mon Apr 15 04:00:00 EDT 2019 · Technical Physics Letters

DOI:https://doi.org/10.1134/S1063785019040321· OSTI ID:22929277

Mukhametova, E. T.; Vakhitov, I. R.; Gumarov, A. I.; Yusupov, R. V.; Tagirov, L. R. ^[1]

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1. Institute of Physics, Kazan Federal University (Russian Federation)

The exchange bias of the magnetic hysteresis loop and the exchange-spring effect have been observed in thin-film heterostructures comprising layers of Pd{sub 0.96}Fe{sub 0.04} low-temperature ferromagnet, metallic cobalt, and cobalt monoxide (CoO) grown on single-crystalline sapphire by methods of magnetron sputtering and molecular beam epitaxy in an ultrahigh-vacuum system. It is established that the exchange anisotropy of Pd{sub 0.96}Fe{sub 0.04} layer in Pd{sub 0.96}Fe{sub 0.04}/CoO/Co/Al{sub 2}O{sub 3} thin-film heterostructure is absent and the exchange-spring effect in this system is not manifested. In the case of a Pd{sub 0.96}Fe{sub 0.04}/Co/CoO/Al{sub 2}O{sub 3} structure, it is shown that, according to the results of magnetometric measurements, the inversion of the order of antiferromagnetic and ferromagnetic layers leads to pinning of the magnetic moment of Pd{sub 0.96}Fe{sub 0.04} layer at the interface with cobalt and to realization of the exchange-spring effect. Additional evidence in favor of this interpretation was obtained using the micromagnetic modeling of magnetic hysteresis loops.

• OSTI ID: 22929277
• Journal Information: Technical Physics Letters, Journal Name: Technical Physics Letters Journal Issue: 4 Vol. 45; ISSN 1063-7850
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ALUMINIUM OXIDES
ANISOTROPY
ANTIFERROMAGNETISM
COBALT OXIDES
FERROMAGNETIC MATERIALS
HYSTERESIS
MAGNETIC MOMENTS
MAGNETRONS
MOLECULAR BEAM EPITAXY
MONOCRYSTALS
PALLADIUM COMPOUNDS
PRESSURE RANGE BELOW 1 NANO PA
SAPPHIRE
SIMULATION
SPUTTERING
TEMPERATURE RANGE 0065-0273 K
THIN FILMS
VACUUM SYSTEMS