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IR Photodetectors Based on Isoperiodic Epitaxial Layers of Lead Tin Chalcogenides

Journal Article · · Technical Physics
;  [1]
  1. Vinnichenko Central Ukrainian State Pedagogical University (Ukraine)
IR photodetectors have been made on Pb/δ-layer/p-Pb{sub 1 –x}Sn{sub x}Te{sub 1 –y}Se{sub y}/p{sup +}-Pb{sub 0.8}Sn{sub 0.2}Te/Au and Au/δ-layer/n-Pb{sub 1 –x}Sn{sub x}Te{sub 1 –y}Se{sub y}(BaF{sub 2})/Pb surface-barrier structures prepared by liquid-phase epitaxy and thermal evaporation. At ~170 K, peak wavelength λ{sub p} ~ 7.9–8.2 μm, and cutoff wavelength λ{sub c} ~ 8.2–8.5 μm, the former surface-barrier structure has product R{sub 0}A (where R{sub 0} is the zero-bias differential resistance and A is the active surface area) = 0.31–0.97 Ω cm{sup 2}, peak quantum efficiency η{sub λ} = 0.32–0.48, and specific detectability D{sub λ}{sup ∗} = (0.72–1.83) × 10{sup 10} cm Hz{sup 1/2} W{sup –1}. For photodiodes made on the latter surface-barrier structure, these parameters measured at ~80 K are R{sub 0}A = 1.71–2.72 Ω cm{sup 2}, η{sub λ} = 0.34–0.49, and D{sub λ}{sup ∗} = (3.02–4.51) × 10{sup 10} cm Hz{sup 1/2} W{sup –1} at λ{sub p} ~ 8.6–12.3 μm and λ{sub c} ~ 9.2–12.9 μm.
OSTI ID:
22927735
Journal Information:
Technical Physics, Journal Name: Technical Physics Journal Issue: 3 Vol. 64; ISSN 1063-7842
Country of Publication:
United States
Language:
English