Toroidal silicon polarization analyzer for resonant inelastic x-ray scattering

Journal Article · Mon Aug 15 00:00:00 EDT 2016 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.4959566· OSTI ID:22597676

Gao, Xuan ^[1]; Casa, Diego; Kim, Jungho; Gog, Thomas ^[2]; Li, Chengyang ^[1]; Burns, Clement ^[1]

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1. Department of Physics, Western Michigan University, Kalamazoo, Michigan 49008-5252 (United States)
2. Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439 (United States)

Resonant Inelastic X-ray Scattering (RIXS) is a powerful probe for studying electronic excitations in materials. Standard high energy RIXS measurements do not measure the polarization of the scattered x-rays, which is unfortunate since it carries information about the nature and symmetry of the excitations involved in the scattering process. Here we report the fabrication of thin Si-based polarization analyzers with a double-concave toroidal surface, useful for L-edge RIXS studies in heavier atoms such as the 5-d transition metals.

• OSTI ID: 22597676
• Journal Information: Review of Scientific Instruments, Vol. 87, Issue 8; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ATOMS
EXCITATION
FABRICATION
POLARIZATION
PROBES
SILICON
SURFACES
SYMMETRY
TRANSITION ELEMENTS
X RADIATION
X-RAY DIFFRACTION