The simultaneous measurement of energy and linear polarization of the scattered radiation in resonant inelastic soft x-ray scattering
- CNR-SPIN and Dipartimento di Fisica, Politecnico di Milano, piazza Leonardo Da Vinci 32, Milano I-20133 (Italy)
- Max-Planck-Institut für Festkörperforschung, Heisenbergstrasse 1, D-70569 Stuttgart (Germany)
- European Synchrotron Radiation Facility, 71 Avenue des Martyrs, Grenoble F-38043 (France)
- Synchrotron Light Research Institute, Nakhon Ratchasima (Thailand)
Resonant Inelastic X-ray Scattering (RIXS) in the soft x-ray range is an element-specific energy-loss spectroscopy used to probe the electronic and magnetic excitations in strongly correlated solids. In the recent years, RIXS has been progressing very quickly in terms of energy resolution and understanding of the experimental results, but the interpretation of spectra could further improve, sometimes decisively, from a full knowledge of the polarization of incident and scattered photons. Here we present the first implementation, in a high resolution soft-RIXS spectrometer used to analyze the scattered radiation, of a device allowing the measurement of the degree of linear polarization. The system, based on a graded W/B{sub 4}C multilayer mirror installed in proximity of the CCD detector, has been installed on the AXES spectrometer at the ESRF (European Synchrotron Radiation Facility); it has been fully characterized and it has been used for a demonstration experiment at the Cu L{sub 3} edge on a high-T{sub c} superconducting cuprate. The loss in efficiency suffered by the spectrometer equipped with this test facility was a factor 17.5. We propose also a more advanced version, suitable for a routine use on the next generation of RIXS spectrometers and with an overall efficiency up to 10%.
- OSTI ID:
- 22392246
- Journal Information:
- Review of Scientific Instruments, Vol. 85, Issue 11; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
- Country of Publication:
- United States
- Language:
- English
Similar Records
A 5-μ m pitch charge-coupled device optimized for resonant inelastic soft X-ray scattering
Innovative diffraction gratings for high-resolution resonant inelastic soft x-ray scattering spectroscopy