Toroidal silicon polarization analyzer for resonant inelastic x-ray scattering

Gao, Xuan; Casa, Diego; Kim, Jungho; Gog, Thomas; Li, Chengyang; Burns, Clement

doi:10.1063/1.4959566

Title: Toroidal silicon polarization analyzer for resonant inelastic x-ray scattering

Journal Article · Mon Aug 15 00:00:00 EDT 2016 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.4959566· OSTI ID:1362111

Gao, Xuan ^[1]; Casa, Diego ^[2]; Kim, Jungho ^[2]; Gog, Thomas ^[2]; Li, Chengyang ^[3]; Burns, Clement ^[4]

Western Michigan Univ., Kalamazoo MI (United States); Chinese Academy of Sciences (CAS), Chongqing (China)
Argonne National Lab. (ANL), Argonne, IL (United States)
Western Michigan Univ., Kalamazoo MI (United States); South Univ. of Science and Technology of China, Shenzhen (China)
Western Michigan Univ., Kalamazoo MI (United States)

Resonant Inelastic X-ray Scattering (RIXS) is a powerful probe for studying electronic excitations in materials. Standard high energy RIXS measurements do not measure the polarization of the scattered x-rays, which is unfortunate since it carries information about the nature and symmetry of the excitations involved in the scattering process. Moreover we report the fabrication of thin Si-based polarization analyzers with a double-concave toroidal surface, useful for L-edge RIXS studies in heavier atoms such as the 5-d transition metals.

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Research Organization:: Argonne National Laboratory (ANL), Argonne, IL (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22), Materials Sciences and Engineering Division; USDOE Office of Science (SC), Basic Energy Sciences (BES). Scientific User Facilities Division

Grant/Contract Number:: AC02-06CH11357

OSTI ID:: 1362111

Journal Information:: Review of Scientific Instruments, Vol. 87, Issue 8; ISSN 0034-6748

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 4 works

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