Scanning SQUID susceptometers with sub-micron spatial resolution

Journal Article · Thu Sep 15 04:00:00 EDT 2016 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.4961982· OSTI ID:22597627

Rosenberg, Aaron J.; Palmstrom, Johanna C.; Holland, Connor M.; Moler, Kathryn A. ^[1]; Paulius, Lisa ^[2]; Spanton, Eric M. ^[3]; Schiessl, Daniel ^[4]; Jermain, Colin L.; Gibbons, Jonathan ^[5]; Fung, Y. -K.K.; Gibson, Gerald W. ^[6]; Huber, Martin E. ^[7]; Ralph, Daniel C. ^[5]; Ketchen, Mark B. ^[8]

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1. Department of Applied Physics, Stanford University, Stanford, California 94305-4045 (United States)
2. Department of Physics, Western Michigan University, Kalamazoo, Michigan 49008-5252 (United States)
3. Department of Physics, Stanford University, Stanford, California 94305-4045 (United States)
4. Attocube Systems AG, Königinstraße 11A, 80539 Munich (Germany)
5. Department of Physics, Cornell University, Cornell, Ithaca, New York 14853 (United States)
6. IBM Research Division, T. J. Watson Research Center, Yorktown Heights, New York 10598 (United States)
7. Department of Physics, University of Colorado Denver, Denver, Colorado 80217-3364 (United States)
8. OcteVue, Hadley, Massachusetts 01035 (United States)

Superconducting QUantum Interference Device (SQUID) microscopy has excellent magnetic field sensitivity, but suffers from modest spatial resolution when compared with other scanning probes. This spatial resolution is determined by both the size of the field sensitive area and the spacing between this area and the sample surface. In this paper we describe scanning SQUID susceptometers that achieve sub-micron spatial resolution while retaining a white noise floor flux sensitivity of ≈2μΦ{sub 0}/Hz{sup 1/2}. This high spatial resolution is accomplished by deep sub-micron feature sizes, well shielded pickup loops fabricated using a planarized process, and a deep etch step that minimizes the spacing between the sample surface and the SQUID pickup loop. We describe the design, modeling, fabrication, and testing of these sensors. Although sub-micron spatial resolution has been achieved previously in scanning SQUID sensors, our sensors not only achieve high spatial resolution but also have integrated modulation coils for flux feedback, integrated field coils for susceptibility measurements, and batch processing. They are therefore a generally applicable tool for imaging sample magnetization, currents, and susceptibilities with higher spatial resolution than previous susceptometers.

• OSTI ID: 22597627
• Journal Information: Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 9 Vol. 87; ISSN 0034-6748; ISSN RSINAK
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
COMPARATIVE EVALUATIONS
DESIGN
FABRICATION
FEEDBACK
IMAGES
INTERFERENCE
MAGNETIC FIELDS
MAGNETIZATION
MICROSCOPY
SENSITIVITY
SENSORS
SIMULATION
SPATIAL RESOLUTION
SQUID DEVICES
SURFACES