Design, fabrication, and performance of integrated miniature SQUID susceptometers

Conference · Wed Mar 01 04:00:00 EST 1989 · IEEE Trans. Magn.; (United States)

OSTI ID:6090883

Ketchen, M B; Awschalom, D D; Gallagher, W J; Kleinsasser, A W; Sandstrom, R L; Rozen, J R; Bumble, B

Integrated, miniature, thin-film dc SQUID susceptometers have now been applied in the investigation of a number of interesting physical systems. The leverage of such susceptometers derives from their ability to measure with extreme sensitivity the magnetic properties of micron size samples at low temperatures. In this paper the authors propose a figure of merit for miniature susceptometers and then discuss how this varies with scaling of dimensions. The range of applications for miniature susceptometers can be considerably broadened through improved magnetic, optical, and thermal isolation between the pickup loops and active SQUID elements. Techniques for integrating such features into single chip structures are reviewed as well as modular designs where SQUID and pickup loops are on physical separate substrates and connected by low inductance wire bonds. Extension of this latter technique should make possible the incorporation of commercial SQUIDs as well as high Tc superconductors. Experimental results on some of the systems are also presented.

• Research Organization: IBM Research Div., T.J. Watson Research Center, Yorktown Heights, NY (US)
• OSTI ID: 6090883
• Report Number(s): CONF-880812-
• Conference Information: Journal Name: IEEE Trans. Magn.; (United States) Journal Volume: 25:2
• Country of Publication: United States
• Language: English

Related Subjects

42 ENGINEERING
420201* -- Engineering-- Cryogenic Equipment & Devices
420800 -- Engineering-- Electronic Circuits & Devices-- (-1989)
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
CRYSTAL STRUCTURE
DATA
DESIGN
ELECTRONIC CIRCUITS
ELECTRONIC EQUIPMENT
EQUIPMENT
EXPERIMENTAL DATA
FABRICATION
FILMS
FLUXMETERS
HIGH TEMPERATURE
INFORMATION
INTEGRATED CIRCUITS
LOW TEMPERATURE
MAGNETIC PROPERTIES
MEASURING INSTRUMENTS
MEASURING METHODS
MICROELECTRONIC CIRCUITS
MICROSTRUCTURE
MICROWAVE EQUIPMENT
NUMERICAL DATA
OPTICAL PROPERTIES
PERFORMANCE
PHYSICAL PROPERTIES
SQUID DEVICES
SUPERCONDUCTING DEVICES
SUPERCONDUCTING FILMS
SUPERCONDUCTORS