Diffusion-driven growth of nanowires by low-temperature molecular beam epitaxy

Journal Article · Thu Apr 28 04:00:00 EDT 2016 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.4947269· OSTI ID:22594647

Rueda-Fonseca, P.; Orrù, M. ^[1]; Bellet-Amalric, E.; Robin, E. ^[1]; Den Hertog, M.; Genuist, Y.; André, R.; Tatarenko, S.

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1. Univ. Grenoble Alpes, F-38000 Grenoble (France)

With ZnTe as an example, we use two different methods to unravel the characteristics of the growth of nanowires (NWs) by gold-catalyzed molecular beam epitaxy at low temperature. In the first approach, CdTe insertions have been used as markers, and the nanowires have been characterized by scanning transmission electron microscopy, including geometrical phase analysis and energy dispersive electron spectrometry; the second approach uses scanning electron microscopy and the statistics of the relationship between the length of the tapered nanowires and their base diameter. Axial and radial growth are quantified using a diffusion-limited model adapted to the growth conditions; analytical expressions describe well the relationship between the NW length and the total molecular flux (taking into account the orientation of the effusion cells), and the catalyst-nanowire contact area. A long incubation time is observed. This analysis allows us to assess the evolution of the diffusion lengths on the substrate and along the nanowire sidewalls, as a function of temperature and deviation from stoichiometric flux.

• OSTI ID: 22594647
• Journal Information: Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 16 Vol. 119; ISSN JAPIAU; ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
CADMIUM TELLURIDES
CATALYSTS
DIFFUSION
DIFFUSION LENGTH
ELECTRON SCANNING
GOLD
MOLECULAR BEAM EPITAXY
MOLECULAR BEAMS
NANOWIRES
PHASE STUDIES
SCANNING ELECTRON MICROSCOPY
SPECTROSCOPY
STATISTICS
STOICHIOMETRY
SUBSTRATES
TEMPERATURE DEPENDENCE
TEMPERATURE RANGE 0065-0273 K
TRANSMISSION ELECTRON MICROSCOPY
ZINC TELLURIDES