Pump-probe Kelvin-probe force microscopy: Principle of operation and resolution limits
Journal Article
·
· Journal of Applied Physics
- Institute of Applied Physics, Technische Universität Dresden, D-01062 Dresden (Germany)
Knowledge on surface potential dynamics is crucial for understanding the performance of modern-type nanoscale devices. We describe an electrical pump-probe approach in Kelvin-probe force microscopy that enables a quantitative measurement of dynamic surface potentials at nanosecond-time and nanometer-length scales. Also, we investigate the performance of pump-probe Kelvin-probe force microscopy with respect to the relevant experimental parameters. We exemplify a measurement on an organic field effect transistor that verifies the undisturbed functionality of our pump-probe approach in terms of simultaneous and quantitative mapping of topographic and electronic information at a high lateral and temporal resolution.
- OSTI ID:
- 22492820
- Journal Information:
- Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 15 Vol. 118; ISSN JAPIAU; ISSN 0021-8979
- Country of Publication:
- United States
- Language:
- English
Similar Records
Half-harmonic Kelvin probe force microscopy with transfer function correction
Open-loop Band excitation Kelvin Probe Force Microscopy
Visualizing Charge Transport and Nanoscale Electrochemistry by Hyperspectral Kelvin Probe Force Microscopy
Journal Article
·
Sat Dec 31 23:00:00 EST 2011
· Applied Physics Letters
·
OSTI ID:1115381
Open-loop Band excitation Kelvin Probe Force Microscopy
Journal Article
·
Sat Dec 31 23:00:00 EST 2011
· Nanotechnology
·
OSTI ID:1042850
Visualizing Charge Transport and Nanoscale Electrochemistry by Hyperspectral Kelvin Probe Force Microscopy
Journal Article
·
Wed Jun 24 00:00:00 EDT 2020
· ACS Applied Materials and Interfaces
·
OSTI ID:1661239