Visualizing Charge Transport and Nanoscale Electrochemistry by Hyperspectral Kelvin Probe Force Microscopy

Collins, Liam; Vasudevan, Rama K.; Sehirlioglu, Alp

doi:10.1021/acsami.0c06426

Visualizing Charge Transport and Nanoscale Electrochemistry by Hyperspectral Kelvin Probe Force Microscopy

Journal Article · Wed Jun 24 00:00:00 EDT 2020 · ACS Applied Materials and Interfaces

DOI:https://doi.org/10.1021/acsami.0c06426· OSTI ID:1661239

^[1]; ^[1]; Sehirlioglu, Alp ^[2]

Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Case Western Reserve Univ., Cleveland, OH (United States)

Charge-transport and electrochemical processes are heavily influenced by the local microstructure. Kelvin probe force microscopy (KPFM) is a widely used technique to map electrochemical potentials at the nanometer scale; however, it offers little information on local charge dynamics. In this study, we implement a hyperspectral KPFM approach for spatially mapping bias-dependent charge dynamics in timescales ranging from the sub-millisecond to the second regime. As a proof of principle, we investigate the role mobile surface charges play in a three-unit-cell LaAlO₃/SrTiO₃ oxide heterostructure. We explore machine learning approaches to assist with visualization, pattern recognition, and interpretation of the information-rich data sets. Linear unmixing methods reveal hidden bias-dependent interfacial processes, most likely water splitting, which are essentially unnoticed by functional fitting of the dynamic response alone. Hyperspectral KPFM will be beneficial for investigating nanoscale charge transport and local reactivity in systems involving a possible combination of electronic, ionic, and electrochemical phenomena.

View Accepted Manuscript (DOE)

Research Organization:: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)

Sponsoring Organization:: Air Force Office of Scientific Research (AFOSR); USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)

Grant/Contract Number:: AC05-00OR22725

OSTI ID:: 1661239

Journal Information:: ACS Applied Materials and Interfaces, Journal Name: ACS Applied Materials and Interfaces Journal Issue: 29 Vol. 12; ISSN 1944-8244

Publisher:: American Chemical Society (ACS)Copyright Statement

Country of Publication:: United States

Language:: English

References (48)

Structure-Property Relation of SrTiO₃/LaAlO₃ Interfaces Huijben, Mark; Brinkman, Alexander; Koster, Gertjan Advanced Materials, Vol. 21, Issue 17, p. 1665-1677 https://doi.org/10.1002/adma.200801448	journal	May 2009
Simultaneous Electronic and Ionic Conduction in a Block Copolymer: Application in Lithium Battery Electrodes Javier, Anna E.; Patel, Shrayesh N.; Hallinan, Daniel T. Angewandte Chemie International Edition, Vol. 50, Issue 42 https://doi.org/10.1002/anie.201102953	journal	September 2011
Time-Resolved Electrostatic and Kelvin Probe Force Microscopy Sadewasser, Sascha; Nicoara, Nicoleta Kelvin Probe Force Microscopy https://doi.org/10.1007/978-3-319-75687-5_5	book	January 2018
Ion and mixed conducting oxides as catalysts Gellings, P. J.; Bouwmeester, H. J. M. Catalysis Today, Vol. 12, Issue 1 https://doi.org/10.1016/0920-5861(92)80046-P	journal	February 1992
The elimination of the ‘artifact’ in the electrostatic force measurement using a novel noncontact atomic force microscope/electrostatic force microscope Okamoto, Kenji; Sugawara, Yasuhiro; Morita, Seizo Applied Surface Science, Vol. 188, Issue 3-4 https://doi.org/10.1016/S0169-4332(01)00953-9	journal	March 2002
Homogenization of Al CoCrFeNi high-entropy alloys with improved corrosion resistance Shi, Yunzhu; Collins, Liam; Feng, Rui Corrosion Science, Vol. 133 https://doi.org/10.1016/j.corsci.2018.01.030	journal	April 2018
Core-level binding energy shifts as a tool to study surface processes on LaAlO 3 /SrTiO 3 Fongkaew, Ittipon; Akrobetu, Richard; Sehirlioglu, Alp Journal of Electron Spectroscopy and Related Phenomena, Vol. 218 https://doi.org/10.1016/j.elspec.2017.05.009	journal	July 2017
Spatially Resolved Probing of Electrochemical Reactions via Energy Discovery Platforms Ding, Jilai; Strelcov, Evgheni; Kalinin, Sergei V. Nano Letters, Vol. 15, Issue 6 https://doi.org/10.1021/acs.nanolett.5b01613	journal	June 2015
Measuring Spatially Resolved Collective Ionic Transport on Lithium Battery Cathodes Using Atomic Force Microscopy Mascaro, Aaron; Wang, Zi; Hovington, Pierre Nano Letters, Vol. 17, Issue 7 https://doi.org/10.1021/acs.nanolett.7b01857	journal	June 2017
Big, Deep, and Smart Data in Scanning Probe Microscopy Kalinin, Sergei V.; Strelcov, Evgheni; Belianinov, Alex ACS Nano, Vol. 10, Issue 10 https://doi.org/10.1021/acsnano.6b04212	journal	September 2016
Breaking the Time Barrier in Kelvin Probe Force Microscopy: Fast Free Force Reconstruction Using the G-Mode Platform Collins, Liam; Ahmadi, Mahshid; Wu, Ting ACS Nano, Vol. 11, Issue 9 https://doi.org/10.1021/acsnano.7b02114	journal	August 2017
Kelvin Probe Force Microscopy of Periodic Ferroelectric Domain Structure in KTiOPO ₄ Crystals Shvebelman, Maria M.; Agronin, Alex G.; Urenski, Ronen P. Nano Letters, Vol. 2, Issue 5 https://doi.org/10.1021/nl025523e	journal	May 2002
Imaging Surface Charges of Individual Biomolecules Leung, Carl; Kinns, Helen; Hoogenboom, Bart W. Nano Letters, Vol. 9, Issue 7 https://doi.org/10.1021/nl9012979	journal	July 2009
Space- and Time-Resolved Mapping of Ionic Dynamic and Electroresistive Phenomena in Lateral Devices Strelcov, Evgheni; Jesse, Stephen; Huang, Yen-Lin ACS Nano, Vol. 7, Issue 8 https://doi.org/10.1021/nn4017873	journal	July 2013
A high-mobility electron gas at the LaAlO3/SrTiO3 heterointerface Ohtomo, A.; Hwang, H. Y. Nature, Vol. 427, Issue 6973 https://doi.org/10.1038/nature02308	journal	January 2004
Giant conductivity switching of LaAlO3/SrTiO3 heterointerfaces governed by surface protonation Brown, Keith A.; He, Shu; Eichelsdoerfer, Daniel J. Nature Communications, Vol. 7, Issue 1 https://doi.org/10.1038/ncomms10681	journal	February 2016
High transconductance organic electrochemical transistors Khodagholy, Dion; Rivnay, Jonathan; Sessolo, Michele Nature Communications, Vol. 4, Issue 1 https://doi.org/10.1038/ncomms3133	journal	July 2013
Probing charge screening dynamics and electrochemical processes at the solid–liquid interface with electrochemical force microscopy Collins, Liam; Jesse, Stephen; Kilpatrick, Jason I. Nature Communications, Vol. 5, Issue 1 https://doi.org/10.1038/ncomms4871	journal	May 2014
Ionic transport in hybrid lead iodide perovskite solar cells Eames, Christopher; Frost, Jarvist M.; Barnes, Piers R. F. Nature Communications, Vol. 6, Issue 1 https://doi.org/10.1038/ncomms8497	journal	June 2015
Nanoscale control of an interfacial metal–insulator transition at room temperature Cen, C.; Thiel, S.; Hammerl, G. Nature Materials, Vol. 7, Issue 4 https://doi.org/10.1038/nmat2136	journal	March 2008
Label-free and high-resolution protein/DNA nanoarray analysis using Kelvin probe force microscopy Sinensky, Asher K.; Belcher, Angela M. Nature Nanotechnology, Vol. 2, Issue 10 https://doi.org/10.1038/nnano.2007.293	journal	September 2007
New opportunities for organic electronics and bioelectronics: ions in action Tarabella, Giuseppe; Mahvash Mohammadi, Farzaneh; Coppedè, Nicola Chemical Science, Vol. 4, Issue 4 https://doi.org/10.1039/c2sc21740f	journal	January 2013
Kelvin probe force microscopy Nonnenmacher, M.; O’Boyle, M. P.; Wickramasinghe, H. K. Applied Physics Letters, Vol. 58, Issue 25 https://doi.org/10.1063/1.105227	journal	June 1991
Practical aspects of Kelvin probe force microscopy Jacobs, H. O.; Knapp, H. F.; Stemmer, A. Review of Scientific Instruments, Vol. 70, Issue 3 https://doi.org/10.1063/1.1149664	journal	March 1999
Noncontact potentiometry of polymer field-effect transistors Bürgi, L.; Sirringhaus, H.; Friend, R. H. Applied Physics Letters, Vol. 80, Issue 16 https://doi.org/10.1063/1.1470702	journal	April 2002
Surface charge dynamics on ferroelectric PbZr0.48Ti0.52O3 films responding to the switching bias of electric force microscope Son, J. Y.; Lee, Geunhee; Shin, Y. -H. Applied Physics Letters, Vol. 94, Issue 16 https://doi.org/10.1063/1.3124077	journal	April 2009
Dual frequency open-loop electric potential microscopy for local potential measurements in electrolyte solution with high ionic strength Kobayashi, Naritaka; Asakawa, Hitoshi; Fukuma, Takeshi Review of Scientific Instruments, Vol. 83, Issue 3 https://doi.org/10.1063/1.3698207	journal	March 2012
Dual harmonic Kelvin probe force microscopy at the graphene–liquid interface Collins, Liam; Kilpatrick, Jason I.; Vlassiouk, Ivan V. Applied Physics Letters, Vol. 104, Issue 13 https://doi.org/10.1063/1.4870074	journal	March 2014
Pump-probe Kelvin-probe force microscopy: Principle of operation and resolution limits Murawski, J.; Graupner, T.; Milde, P. Journal of Applied Physics, Vol. 118, Issue 15 https://doi.org/10.1063/1.4933289	journal	October 2015
Quantitative comparison of closed-loop and dual harmonic Kelvin probe force microscopy techniques Kilpatrick, Jason I.; Collins, Liam; Weber, Stefan A. L. Review of Scientific Instruments, Vol. 89, Issue 12 https://doi.org/10.1063/1.5025432	journal	December 2018
Intermodulation spectroscopy as an alternative to pump-probe for the measurement of fast dynamics at the nanometer scale Borgani, Riccardo; Haviland, David B. Review of Scientific Instruments, Vol. 90, Issue 1 https://doi.org/10.1063/1.5060727	journal	January 2019
Geometric artefact suppressed surface potential measurements Lee, Minhwan; Lee, Wonyoung; Prinz, Fritz B. Nanotechnology, Vol. 17, Issue 15 https://doi.org/10.1088/0957-4484/17/15/019	journal	June 2006
Principal component and spatial correlation analysis of spectroscopic-imaging data in scanning probe microscopy Jesse, Stephen; Kalinin, Sergei V. Nanotechnology, Vol. 20, Issue 8 https://doi.org/10.1088/0957-4484/20/8/085714	journal	February 2009
Open loop Kelvin probe force microscopy with single and multi-frequency excitation Collins, L.; Kilpatrick, J. I.; Weber, S. A. L. Nanotechnology, Vol. 24, Issue 47 https://doi.org/10.1088/0957-4484/24/47/475702	journal	October 2013
Electrochemical reactivity and proton transport mechanisms in nanostructured ceria Ding, J.; Strelcov, E.; Kalinin, S. V. Nanotechnology, Vol. 27, Issue 34 https://doi.org/10.1088/0957-4484/27/34/345401	journal	July 2016
Oxygen vacancies and hydrogen doping in LaAlO ₃ /SrTiO ₃ heterostructures: electronic properties and impact on surface and interface reconstruction Piyanzina, I. I.; Eyert, V.; Lysogorskiy, Yu V. Journal of Physics: Condensed Matter, Vol. 31, Issue 29 https://doi.org/10.1088/1361-648X/ab1831	journal	May 2019
Towards nanoscale electrical measurements in liquid by advanced KPFM techniques: a review Collins, Liam; Kilpatrick, Jason I.; Kalinin, Sergei V. Reports on Progress in Physics, Vol. 81, Issue 8 https://doi.org/10.1088/1361-6633/aab560	journal	July 2018
Local electronic transport at grain boundaries in Nb-doped Sr Ti O 3 Kalinin, Sergei V.; Bonnell, Dawn A. Physical Review B, Vol. 70, Issue 23 https://doi.org/10.1103/PhysRevB.70.235304	journal	December 2004
Effects of structural relaxation, interdiffusion, and surface termination on two-dimensional electron gas formation at the LaAlO 3 / SrTiO 3 (001) interface Fongkaew, Ittipon; Limpijumnnong, Sukit; Lambrecht, Walter R. L. Physical Review B, Vol. 92, Issue 15 https://doi.org/10.1103/PhysRevB.92.155416	journal	October 2015
Diffuse-charge dynamics in electrochemical systems Bazant, Martin Z.; Thornton, Katsuyo; Ajdari, Armand Physical Review E, Vol. 70, Issue 2 https://doi.org/10.1103/PhysRevE.70.021506	journal	August 2004
Atomic Force Microscope Binnig, G.; Quate, C. F.; Gerber, Ch. Physical Review Letters, Vol. 56, Issue 9 https://doi.org/10.1103/PhysRevLett.56.930	journal	March 1986
Simulation and correction of geometric distortions in scanning Kelvin probe microscopy Efimov, Anton; Cohen, Sidney R. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, Vol. 18, Issue 4 https://doi.org/10.1116/1.582472	journal	July 2000
Kelvin probe force microscopy for characterization of semiconductor devices and processes Tanimoto, Masafumi Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, Vol. 14, Issue 2 https://doi.org/10.1116/1.589136	journal	March 1996
Tunable Quasi-Two-Dimensional Electron Gases in Oxide Heterostructures Thiel, S. Science, Vol. 313, Issue 5795, p. 1942-1945 https://doi.org/10.1126/science.1131091	journal	September 2006
Kelvin Probe Force Microscopy without Bias-Voltage Feedback Takeuchi, Osamu; Ohrai, Yoshihisa; Yoshida, Shoji Japanese Journal of Applied Physics, Vol. 46, Issue 8B https://doi.org/10.1143/JJAP.46.5626	journal	August 2007
Electrochemical strain microscopy: Probing ionic and electrochemical phenomena in solids at the nanometer level Jesse, Stephen; Kumar, Amit; Arruda, Thomas M. MRS Bulletin, Vol. 37, Issue 7 https://doi.org/10.1557/mrs.2012.144	journal	July 2012
Kelvin probe force microscopy in liquid using electrochemical force microscopy Collins, Liam; Jesse, Stephen; Kilpatrick, Jason I. Beilstein Journal of Nanotechnology, Vol. 6 https://doi.org/10.3762/bjnano.6.19	journal	January 2015
Multi-Domain Formation in ZnO/Al2O3(0001) Heteroepitaxial Films Kim, In-Woo; Kim, Hye-Jin; Lee, Kyu-Mann Journal of the Korean Physical Society, Vol. 53, Issue 1 https://doi.org/10.3938/jkps.53.33	journal	July 2008

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37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
Charge Transport
Hyperspectral Imaging
Kelvin Probe Force Microscopy
LaAlO3/SrTiO3 oxide heterostructure
Oxygen Vacancies
Time Resolved

Visualizing Charge Transport and Nanoscale Electrochemistry by Hyperspectral Kelvin Probe Force Microscopy

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