High-speed mapping of surface charge dynamics using sparse scanning Kelvin probe force microscopy

Checa, Marti; Fuhr, Addis S.; Sun, Changhyo; Vasudevan, Rama; Ziatdinov, Maxim; Ivanov, Ilia; Yun, Seok Joon; Xiao, Kai; Sehirlioglu, Alp; Kim, Yunseok; Sharma, Pankaj; Kelley, Kyle P.; Domingo, Neus; Jesse, Stephen; Collins, Liam

doi:10.1038/s41467-023-42583-x

High-speed mapping of surface charge dynamics using sparse scanning Kelvin probe force microscopy

Journal Article · Wed Nov 08 00:00:00 EST 2023 · Nature Communications

DOI:https://doi.org/10.1038/s41467-023-42583-x· OSTI ID:2217730

^[1]; Fuhr, Addis S. ^[1]; Sun, Changhyo ^[2]; ^[1]; ^[1]; ^[1]; ^[3]; ^[1]; ^[4]; ^[2]; ^[5]; ^[1]; Domingo, Neus ^[1]; Jesse, Stephen ^[1]; Collins, Liam ^[1]

Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
Sungkyunkwan Univ., Suwon (Republic of Korea)
Univ. of Ulsan (Korea, Republic of); Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
Case Western Reserve Univ., Cleveland, OH (United States)
Flinders Univ., Adelaide, SA (Australia); Univ. of New South Wales, Sydney, NSW (Australia). ARC Centre of Excellence in Future Low-Energy Electronics Technologies (FLEET)

Unraveling local dynamic charge processes is vital for progress in diverse fields, from microelectronics to energy storage. This relies on the ability to map charge carrier motion across multiple length- and timescales and understanding how these processes interact with the inherent material heterogeneities. Towards addressing this challenge, we introduce high-speed sparse scanning Kelvin probe force microscopy, which combines sparse scanning and image reconstruction. This approach is shown to enable sub-second imaging (>3 frames per second) of nanoscale charge dynamics, representing several orders of magnitude improvement over traditional Kelvin probe force microscopy imaging rates. Bridging this improved spatiotemporal resolution with macroscale device measurements, we successfully visualize electrochemically mediated diffusion of mobile surface ions on a LaAlO₃/SrTiO₃ planar device. Such processes are known to impact band-alignment and charge-transfer dynamics at these heterointerfaces. Furthermore, we monitor the diffusion of oxygen vacancies at the single grain level in polycrystalline TiO₂. Through temperature-dependent measurements, we identify a charge diffusion activation energy of 0.18 eV, in good agreement with previously reported values and confirmed by DFT calculations. Together, these findings highlight the effectiveness and versatility of our method in understanding ionic charge carrier motion in microelectronics or nanoscale material systems.

View Accepted Manuscript (DOE)

Research Organization:: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)

Sponsoring Organization:: National Research Foundation of Korea (NRF); US Air Force Office of Scientific Research (AFOSR); USDOE Office of Science (SC), Basic Energy Sciences (BES). Materials Sciences & Engineering Division (MSE)

Grant/Contract Number:: AC05-00OR22725

OSTI ID:: 2217730

Journal Information:: Nature Communications, Journal Name: Nature Communications Journal Issue: 1 Vol. 14; ISSN 2041-1723

Publisher:: Nature Publishing GroupCopyright Statement

Country of Publication:: United States

Language:: English

References (92)

mchecanu/Spiral-scanning-KPFM: sparsescanningKPFM_v1 Checa, Marti https://doi.org/10.5281/zenodo.8422951	software	October 2023
A Kelvin Probe Force Microscopy Study of the Photogeneration of Surface Charges in All-Thiophene Photovoltaic Blends Palermo, V.; Ridolfi, G.; Talarico, A. M. Advanced Functional Materials, Vol. 17, Issue 3 https://doi.org/10.1002/adfm.200600122	journal	February 2007
Transit Phenomena in Organic Field‐Effect Transistors Through Kelvin‐Probe Force Microscopy Melzer, Christian; Siol, Christopher; von Seggern, Heinz Advanced Materials, Vol. 25, Issue 31 https://doi.org/10.1002/adma.201300004	journal	April 2013
Direct Probing of Charge Injection and Polarization-Controlled Ionic Mobility on Ferroelectric LiNbO ₃ Surfaces Strelcov, Evgheni; Ievlev, Anton V.; Jesse, Stephen Advanced Materials, Vol. 26, Issue 6 https://doi.org/10.1002/adma.201304002	journal	November 2013
Role of Oxygen Vacancies at the TiO₂/HfO₂ Interface in Flexible Oxide‐Based Resistive Switching Memory Zhang, Rulin; Huang, Hong; Xia, Qing Advanced Electronic Materials, Vol. 5, Issue 5 https://doi.org/10.1002/aelm.201800833	journal	April 2019
Effect of Humidity on the Writing Speed and Domain Wall Dynamics of Ferroelectric Domains Spasojevic, Irena; Verdaguer, Albert; Catalan, Gustau Advanced Electronic Materials https://doi.org/10.1002/aelm.202100650	journal	September 2021
Modulating Nanoinhomogeneity at Electrode–Solid Electrolyte Interfaces for Dendrite‐Proof Solid‐State Batteries and Long‐Life Memristors Lu, Ziheng; Yang, Ziwei; Li, Cheng Advanced Energy Materials, Vol. 11, Issue 16 https://doi.org/10.1002/aenm.202003811	journal	March 2021
Use of Kelvin probe force microscopy to achieve a locally and time-resolved analysis of the photovoltage generated in dye-sensitized ZnO electrodes Beu, Max; Klinkmüller, Kathleen; Schlettwein, Derck physica status solidi (a), Vol. 211, Issue 9 https://doi.org/10.1002/pssa.201431336	journal	July 2014
Fast Scanning Probe Microscopy via Machine Learning: Non‐Rectangular Scans with Compressed Sensing and Gaussian Process Optimization Kelley, Kyle P.; Ziatdinov, Maxim; Collins, Liam Small, Vol. 16, Issue 37 https://doi.org/10.1002/smll.202002878	journal	August 2020
Growth Mechanism of Alternating Defect Domains in Hexagonal WS ₂ via Inhomogeneous W‐Precursor Accumulation An, Gwang Hwi; Yun, Seok Joon; Lee, Young Hee Small, Vol. 16, Issue 43 https://doi.org/10.1002/smll.202003326	journal	September 2020
Time-Resolved Electrostatic and Kelvin Probe Force Microscopy Sadewasser, Sascha; Nicoara, Nicoleta Kelvin Probe Force Microscopy https://doi.org/10.1007/978-3-319-75687-5_5	book	January 2018
KPFM and PFM of Biological Systems Rodriguez, B. J.; Kalinin, S. V. Kelvin Probe Force Microscopy https://doi.org/10.1007/978-3-642-22566-6_12	book	September 2011
Efficiency of ab-initio total energy calculations for metals and semiconductors using a plane-wave basis set Kresse, G.; Furthmüller, J. Computational Materials Science, Vol. 6, Issue 1, p. 15-50 https://doi.org/10.1016/0927-0256(96)00008-0	journal	July 1996
Kelvin probe force microscopy for the nano scale characterization of chalcopyrite solar cell materials and devices Sadewasser, S.; Glatzel, Th.; Schuler, S. Thin Solid Films, Vol. 431-432 https://doi.org/10.1016/S0040-6090(03)00267-0	journal	May 2003
Homogenization of Al CoCrFeNi high-entropy alloys with improved corrosion resistance Shi, Yunzhu; Collins, Liam; Feng, Rui Corrosion Science, Vol. 133 https://doi.org/10.1016/j.corsci.2018.01.030	journal	April 2018
Contact electrification and charge decay on polyester fibres: A KPFM study Yin, Jun; Nysten, Bernard Journal of Electrostatics, Vol. 96 https://doi.org/10.1016/j.elstat.2018.09.002	journal	December 2018
TiO2 photocatalysis: Design and applications Nakata, Kazuya; Fujishima, Akira Journal of Photochemistry and Photobiology C: Photochemistry Reviews, Vol. 13, Issue 3 https://doi.org/10.1016/j.jphotochemrev.2012.06.001	journal	September 2012
Contour-oriented automatic tracking based on Gaussian processes for atomic force microscopy Yang, Chengfei; Wang, Wenting; Chen, Yuhang Measurement, Vol. 148 https://doi.org/10.1016/j.measurement.2019.106951	journal	December 2019
Image reconstruction for sub-sampled atomic force microscopy images using deep neural networks Luo, Yufan; Andersson, Sean B. Micron, Vol. 130 https://doi.org/10.1016/j.micron.2019.102814	journal	March 2020
Ionic transport in nano-sized systems Maier, J. Solid State Ionics, Vol. 175, Issue 1-4 https://doi.org/10.1016/j.ssi.2004.09.051	journal	November 2004
A DFT+U description of oxygen vacancies at the TiO2 rutile (110) surface Morgan, Benjamin J.; Watson, Graeme W. Surface Science, Vol. 601, Issue 21 https://doi.org/10.1016/j.susc.2007.08.025	journal	November 2007
A microscopic view of charge transport in polymer transistors Bürgi, Lukas; Richards, Tim; Chiesa, Marco Synthetic Metals, Vol. 146, Issue 3 https://doi.org/10.1016/j.synthmet.2004.08.009	journal	November 2004
Classical and Emerging Characterization Techniques for Investigation of Ion Transport Mechanisms in Crystalline Fast Ionic Conductors Gao, Yirong; Nolan, Adelaide M.; Du, Peng Chemical Reviews, Vol. 120, Issue 13 https://doi.org/10.1021/acs.chemrev.9b00747	journal	April 2020
Oxygen Vacancies of Anatase(101): Extreme Sensitivity to the Density Functional Theory Method Ha, Mai-Anh; Alexandrova, Anastassia N. Journal of Chemical Theory and Computation, Vol. 12, Issue 6 https://doi.org/10.1021/acs.jctc.6b00095	journal	May 2016
Oxygen Vacancy Diffusion in Rutile TiO₂: Insight from Deep Neural Network Potential Simulations Wu, Zhihong; Yin, Wen-Jin; Wen, Bo The Journal of Physical Chemistry Letters, Vol. 14, Issue 8 https://doi.org/10.1021/acs.jpclett.2c03827	journal	February 2023
Ergodic and Nonergodic Dynamics of Oxygen Vacancy Migration at the Nanoscale in Inorganic Perovskites Dagdeviren, Omur E.; Mascaro, Aaron; Yuan, Shuaishuai Nano Letters, Vol. 20, Issue 10 https://doi.org/10.1021/acs.nanolett.0c03002	journal	September 2020
The Effect of Photoinduced Surface Oxygen Vacancies on the Charge Carrier Dynamics in TiO ₂ Films Dagdeviren, Omur E.; Glass, Daniel; Sapienza, Riccardo Nano Letters, Vol. 21, Issue 19 https://doi.org/10.1021/acs.nanolett.1c02853	journal	September 2021
Spatially Resolved Probing of Electrochemical Reactions via Energy Discovery Platforms Ding, Jilai; Strelcov, Evgheni; Kalinin, Sergei V. Nano Letters, Vol. 15, Issue 6 https://doi.org/10.1021/acs.nanolett.5b01613	journal	June 2015
Real-Time Nanoscale Open-Circuit Voltage Dynamics of Perovskite Solar Cells Garrett, Joseph L.; Tennyson, Elizabeth M.; Hu, Miao Nano Letters, Vol. 17, Issue 4 https://doi.org/10.1021/acs.nanolett.7b00289	journal	March 2017
Surface Dynamics of Charge Transport in LaAlO₃/SrTiO₃ with Time-Resolved Kelvin Probe Force Microscopy Smith, Hugh; Collins, Liam; Sehirlioglu, Alp ACS Applied Electronic Materials, Vol. 4, Issue 1 https://doi.org/10.1021/acsaelm.1c00954	journal	December 2021
Visualizing Charge Transport and Nanoscale Electrochemistry by Hyperspectral Kelvin Probe Force Microscopy Collins, Liam; Vasudevan, Rama K.; Sehirlioglu, Alp ACS Applied Materials & Interfaces, Vol. 12, Issue 29 https://doi.org/10.1021/acsami.0c06426	journal	June 2020
Revealing Fast Cu-Ion Transport and Enhanced Conductivity at the CuInP₂S₆–In_4/3P₂S₆ Heterointerface Checa, Marti; Jin, Xin; Millan-Solsona, Ruben ACS Nano, Vol. 16, Issue 9 https://doi.org/10.1021/acsnano.2c06992	journal	August 2022
High-Speed Electrochemical Imaging Momotenko, Dmitry; Byers, Joshua C.; McKelvey, Kim ACS Nano, Vol. 9, Issue 9 https://doi.org/10.1021/acsnano.5b02792	journal	August 2015
Breaking the Time Barrier in Kelvin Probe Force Microscopy: Fast Free Force Reconstruction Using the G-Mode Platform Collins, Liam; Ahmadi, Mahshid; Wu, Ting ACS Nano, Vol. 11, Issue 9 https://doi.org/10.1021/acsnano.7b02114	journal	August 2017
A Density Functional Theory + U Study of Oxygen Vacancy Formation at the (110), (100), (101), and (001) Surfaces of Rutile TiO ₂ Morgan, Benjamin J.; Watson, Graeme W. The Journal of Physical Chemistry C, Vol. 113, Issue 17 https://doi.org/10.1021/jp811288n	journal	April 2009
Kelvin Probe Force Microscopy Study on Conjugated Polymer/Fullerene Bulk Heterojunction Organic Solar Cells Hoppe, H.; Glatzel, T.; Niggemann, M. Nano Letters, Vol. 5, Issue 2 https://doi.org/10.1021/nl048176c	journal	February 2005
Charge Writing at the LaAlO ₃ /SrTiO ₃ Surface Xie, Yanwu; Bell, Christopher; Yajima, Takeaki Nano Letters, Vol. 10, Issue 7 https://doi.org/10.1021/nl1012695	journal	July 2010
Probing Local Ionic Dynamics in Functional Oxides at the Nanoscale Strelcov, Evgheni; Kim, Yunseok; Jesse, Stephen Nano Letters, Vol. 13, Issue 8 https://doi.org/10.1021/nl400780d	journal	July 2013
Space- and Time-Resolved Mapping of Ionic Dynamic and Electroresistive Phenomena in Lateral Devices Strelcov, Evgheni; Jesse, Stephen; Huang, Yen-Lin ACS Nano, Vol. 7, Issue 8 https://doi.org/10.1021/nn4017873	journal	July 2013
Fatigue-free ferroelectric capacitors with platinum electrodes de Araujo, C. A-Paz; Cuchiaro, J. D.; McMillan, L. D. Nature, Vol. 374, Issue 6523 https://doi.org/10.1038/374627a0	journal	April 1995
A high-mobility electron gas at the LaAlO3/SrTiO3 heterointerface Ohtomo, A.; Hwang, H. Y. Nature, Vol. 427, Issue 6973 https://doi.org/10.1038/nature02308	journal	January 2004
Observation of conducting filament growth in nanoscale resistive memories Yang, Yuchao; Gao, Peng; Gaba, Siddharth Nature Communications, Vol. 3, Issue 1 https://doi.org/10.1038/ncomms1737	journal	January 2012
Time-resolved electrostatic force microscopy of polymer solar cells Coffey, David C.; Ginger, David S. Nature Materials, Vol. 5, Issue 9 https://doi.org/10.1038/nmat1712	journal	August 2006
Imaging the charge distribution within a single molecule Mohn, Fabian; Gross, Leo; Moll, Nikolaj Nature Nanotechnology, Vol. 7, Issue 4 https://doi.org/10.1038/nnano.2012.20	journal	February 2012
Rh single atoms on TiO2 dynamically respond to reaction conditions by adapting their site Tang, Yan; Asokan, Chithra; Xu, Mingjie Nature Communications, Vol. 10, Issue 1 https://doi.org/10.1038/s41467-019-12461-6	journal	October 2019
Revealing the role of the cathode–electrolyte interface on solid-state batteries Zahiri, Beniamin; Patra, Arghya; Kiggins, Chadd Nature Materials, Vol. 20, Issue 10 https://doi.org/10.1038/s41563-021-01016-0	journal	May 2021
Theoretical insights into the surface physics and chemistry of redox-active oxides Rousseau, Roger; Glezakou, Vassiliki-Alexandra; Selloni, Annabella Nature Reviews Materials, Vol. 5, Issue 6 https://doi.org/10.1038/s41578-020-0198-9	journal	May 2020
Metal–insulator transition tuned by oxygen vacancy migration across TiO2/VO2 interface Lu, Qiyang; Sohn, Changhee; Hu, Guoxiang Scientific Reports, Vol. 10, Issue 1 https://doi.org/10.1038/s41598-020-75695-1	journal	October 2020
Nanoscale imaging of mobile carriers and trapped charges in delta doped silicon p–n junctions Gramse, Georg; Kölker, Alexander; Škereň, Tomáš Nature Electronics, Vol. 3, Issue 9 https://doi.org/10.1038/s41928-020-0450-8	journal	July 2020
Atomic-resolved depth profile of strain and cation intermixing around LaAlO3/SrTiO3 interfaces Zaid, H.; Berger, M. H.; Jalabert, D. Scientific Reports, Vol. 6, Issue 1 https://doi.org/10.1038/srep28118	journal	June 2016
A study of dynamic nanoscale corrosion initiation events using HS-AFM Moore, Stacy; Burrows, Robert; Picco, Loren Faraday Discussions, Vol. 210 https://doi.org/10.1039/C8FD00017D	journal	January 2018
Surface charged species and electrochemistry of ferroelectric thin films Domingo, Neus; Gaponenko, Iaroslav; Cordero-Edwards, Kumara Nanoscale, Vol. 11, Issue 38 https://doi.org/10.1039/C9NR05526F	journal	January 2019
High-resolution imaging of contact potential difference with ultrahigh vacuum noncontact atomic force microscope Kitamura, Shin’ichi; Iwatsuki, Masashi Applied Physics Letters, Vol. 72, Issue 24 https://doi.org/10.1063/1.121577	journal	June 1998
High-sensitivity quantitative Kelvin probe microscopy by noncontact ultra-high-vacuum atomic force microscopy Sommerhalter, Ch.; Matthes, Th. W.; Glatzel, Th. Applied Physics Letters, Vol. 75, Issue 2 https://doi.org/10.1063/1.124357	journal	July 1999
Comparing the kinetics of bias stress in organic field-effect transistors with different dielectric interfaces Ng, Tse Nga; Marohn, John A.; Chabinyc, Michael L. Journal of Applied Physics, Vol. 100, Issue 8 https://doi.org/10.1063/1.2358410	journal	October 2006
Thickness dependence of the mobility at the LaAlO3/SrTiO3 interface Bell, C.; Harashima, S.; Hikita, Y. Applied Physics Letters, Vol. 94, Issue 22 https://doi.org/10.1063/1.3149695	journal	June 2009
Charging and discharging of graphene in ambient conditions studied with scanning probe microscopy Verdaguer, A.; Cardellach, M.; Segura, J. J. Applied Physics Letters, Vol. 94, Issue 23 https://doi.org/10.1063/1.3149770	journal	June 2009
Strain relaxation analysis of LaAlO ₃ /SrTiO ₃ heterostructure using reciprocal lattice mapping Wei, Wei; Sehirlioglu, Alp Applied Physics Letters, Vol. 100, Issue 7 https://doi.org/10.1063/1.3685463	journal	February 2012
High-speed Lissajous-scan atomic force microscopy: Scan pattern planning and control design issues Bazaei, A.; Yong, Yuen K.; Moheimani, S. O. Reza Review of Scientific Instruments, Vol. 83, Issue 6 https://doi.org/10.1063/1.4725525	journal	June 2012
Charge transfer between reduced graphene oxide sheets on insulating substrates Shen, Yue; Zhang, Xueqiang; Wang, Ying Applied Physics Letters, Vol. 103, Issue 5 https://doi.org/10.1063/1.4817252	journal	July 2013
The resistive switching in TiO ₂ films studied by conductive atomic force microscopy and Kelvin probe force microscopy Du, Yuanmin; Kumar, Amit; Pan, Hui AIP Advances, Vol. 3, Issue 8 https://doi.org/10.1063/1.4818119	journal	August 2013
Influence of external electric fields on oxygen vacancies at the anatase (101) surface Selçuk, Sencer; Selloni, Annabella The Journal of Chemical Physics, Vol. 141, Issue 8 https://doi.org/10.1063/1.4893559	journal	August 2014
Intermodulation electrostatic force microscopy for imaging surface photo-voltage Borgani, Riccardo; Forchheimer, Daniel; Bergqvist, Jonas Applied Physics Letters, Vol. 105, Issue 14 https://doi.org/10.1063/1.4897966	journal	October 2014
Pump-probe Kelvin-probe force microscopy: Principle of operation and resolution limits Murawski, J.; Graupner, T.; Milde, P. Journal of Applied Physics, Vol. 118, Issue 15 https://doi.org/10.1063/1.4933289	journal	October 2015
The limit of time resolution in frequency modulation atomic force microscopy by a pump-probe approach Schumacher, Zeno; Spielhofer, Andreas; Miyahara, Yoichi Applied Physics Letters, Vol. 110, Issue 5 https://doi.org/10.1063/1.4975629	journal	January 2017
Morphology-dependent photo-induced polarization recovery in ferroelectric thin films Wang, J. Y.; Liu, G.; Sando, D. Applied Physics Letters, Vol. 111, Issue 9 https://doi.org/10.1063/1.4990839	journal	August 2017
Role of the different defects, their population and distribution in the LaAlO ₃ /SrTiO ₃ heterostructure's behavior Zaid, H.; Berger, M. H.; Jalabert, D. Journal of Applied Physics, Vol. 123, Issue 15 https://doi.org/10.1063/1.5024554	journal	April 2018
Spiral high-speed scanning tunneling microscopy: Tracking atomic diffusion on the millisecond timescale Gura, L.; Yang, Z.; Brinker, M. Applied Physics Letters, Vol. 119, Issue 25 https://doi.org/10.1063/5.0071340	journal	December 2021
Fast spiral-scan atomic force microscopy Mahmood, I. A.; Reza Moheimani, S. O. Nanotechnology, Vol. 20, Issue 36 https://doi.org/10.1088/0957-4484/20/36/365503	journal	August 2009
High-speed cycloid-scan atomic force microscopy Yong, Y. K.; Moheimani, S. O. R.; Petersen, I. R. Nanotechnology, Vol. 21, Issue 36 https://doi.org/10.1088/0957-4484/21/36/365503	journal	August 2010
The stray capacitance effect in Kelvin probe force microscopy using FM, AM and heterodyne AM modes Ma, Zong Min; Kou, Lili; Naitoh, Yoshitaka Nanotechnology, Vol. 24, Issue 22 https://doi.org/10.1088/0957-4484/24/22/225701	journal	April 2013
Improved accuracy and speed in scanning probe microscopy by image reconstruction from non-gridded position sensor data Ziegler, Dominik; Meyer, Travis R.; Farnham, Rodrigo Nanotechnology, Vol. 24, Issue 33 https://doi.org/10.1088/0957-4484/24/33/335703	journal	July 2013
Fast, high-resolution surface potential measurements in air with heterodyne Kelvin probe force microscopy Garrett, Joseph L.; Munday, Jeremy N. Nanotechnology, Vol. 27, Issue 24 https://doi.org/10.1088/0957-4484/27/24/245705	journal	May 2016
Enhancing the metrological performance of non-raster scanning probe microscopy using Gaussian process regression Zhou, Weiyan; Ren, Mingjun; Tao, Yidan Measurement Science and Technology, Vol. 30, Issue 9 https://doi.org/10.1088/1361-6501/ab1d27	journal	July 2019
Automated piezoresponse force microscopy domain tracking during fast thermally stimulated phase transition in CuInP₂S₆ ^* Checa, M.; Kelley, K. P.; Vasudevan, R. Nanotechnology, Vol. 34, Issue 32 https://doi.org/10.1088/1361-6528/acd34d	journal	May 2023
Towards nanoscale electrical measurements in liquid by advanced KPFM techniques: a review Collins, Liam; Kilpatrick, Jason I.; Kalinin, Sergei V. Reports on Progress in Physics, Vol. 81, Issue 8 https://doi.org/10.1088/1361-6633/aab560	journal	July 2018
A sparse-sampling strategy for the estimation of large-scale clustering from redshift surveys Kaiser, N. Monthly Notices of the Royal Astronomical Society, Vol. 219, Issue 4 https://doi.org/10.1093/mnras/219.4.785	journal	April 1986
Efficient iterative schemes for ab initio total-energy calculations using a plane-wave basis set Kresse, G.; Furthmüller, J. Physical Review B, Vol. 54, Issue 16, p. 11169-11186 https://doi.org/10.1103/PhysRevB.54.11169	journal	October 1996
Surface and subsurface oxygen vacancies in anatase TiO 2 and differences with rutile Cheng, Hongzhi; Selloni, Annabella Physical Review B, Vol. 79, Issue 9 https://doi.org/10.1103/PhysRevB.79.092101	journal	March 2009
Polarity-induced oxygen vacancies at LaAlO 3 ∕ SrTiO 3 interfaces Zhong, Zhicheng; Xu, P. X.; Kelly, Paul J. Physical Review B, Vol. 82, Issue 16 https://doi.org/10.1103/PhysRevB.82.165127	journal	October 2010
Polarizing Oxygen Vacancies in Insulating Metal Oxides under a High Electric Field Youssef, Mostafa; Van Vliet, Krystyn J.; Yildiz, Bilge Physical Review Letters, Vol. 119, Issue 12 https://doi.org/10.1103/PhysRevLett.119.126002	journal	September 2017
Non-raster sampling in atomic force microscopy: A compressed sensing approach Andersson, S. B.; Pao, L. Y. 2012 American Control Conference - ACC 2012, 2012 American Control Conference (ACC) https://doi.org/10.1109/ACC.2012.6315406	conference	June 2012
Task Space Motion Control for AFM-Based Nanorobot Using Optimal and Ultralimit Archimedean Spiral Local Scan Sun, Zhiyong; Xi, Ning; Xue, Yuxuan IEEE Robotics and Automation Letters, Vol. 5, Issue 2 https://doi.org/10.1109/LRA.2019.2955942	journal	April 2020
Ideal Scan Path for High-Speed Atomic Force Microscopy Ziegler, Dominik; Meyer, Travis R.; Amrein, Andreas IEEE/ASME Transactions on Mechatronics, Vol. 22, Issue 1 https://doi.org/10.1109/TMECH.2016.2615327	journal	February 2017
Accelerated High-Dimensional MR Imaging With Sparse Sampling Using Low-Rank Tensors He, Jingfei; Liu, Qiegen; Christodoulou, Anthony G. IEEE Transactions on Medical Imaging, Vol. 35, Issue 9 https://doi.org/10.1109/TMI.2016.2550204	journal	September 2016
Measuring the Charge State of an Adatom with Noncontact Atomic Force Microscopy Gross, L.; Mohn, F.; Liljeroth, P. Science, Vol. 324, Issue 5933 https://doi.org/10.1126/science.1172273	journal	June 2009
Reaction of O2 with Subsurface Oxygen Vacancies on TiO2 Anatase (101) Setvin, M.; Aschauer, U.; Scheiber, P. Science, Vol. 341, Issue 6149 https://doi.org/10.1126/science.1239879	journal	August 2013
Molecular structure elucidation with charge-state control Fatayer, Shadi; Albrecht, Florian; Zhang, Yunlong Science, Vol. 365, Issue 6449 https://doi.org/10.1126/science.aax5895	journal	July 2019
Role of Lattice Strain and Defect Chemistry on the Oxygen Vacancy Migration at the (8.3% Y ₂ O ₃ -ZrO ₂ ) / SrTiO ₃ Hetero-Interface: A First Principles Study Kushima, Akihiro; Yildiz, Bilge ECS Transactions, Vol. 25, Issue 2 https://doi.org/10.1149/1.3205696	journal	September 2009
Dielectric Imaging of Fixed HeLa Cells by In-Liquid Scanning Dielectric Force Volume Microscopy Checa, Martí; Millan-Solsona, Ruben; Glinkowska Mares, Adrianna Nanomaterials, Vol. 11, Issue 6 https://doi.org/10.3390/nano11061402	journal	May 2021
Kelvin probe force microscopy of nanocrystalline TiO ₂ photoelectrodes Henning, Alex; Günzburger, Gino; Jöhr, Res Beilstein Journal of Nanotechnology, Vol. 4 https://doi.org/10.3762/bjnano.4.49	journal	January 2013
Know your full potential: Quantitative Kelvin probe force microscopy on nanoscale electrical devices Axt, Amelie; Hermes, Ilka M.; Bergmann, Victor W. Beilstein Journal of Nanotechnology, Vol. 9 https://doi.org/10.3762/bjnano.9.172	journal	January 2018

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