Formation of titanium carbonitride film by laser treatment: Structural and transport properties

Journal Article · Wed Jun 24 00:00:00 EDT 2015 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.4917959· OSTI ID:22490418

Soni, Sheetal; Pandey, A.; Gupta, Ratnesh ^[1]

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1. School of Instrumentation, Devi Ahilya University, Khandwa Road, Indore-452001 (India)

In-plane and Out-of-plane Grazing incidence X-ray diffraction is used to characterize the preferred orientation present in the titanium carbonitride films using ADXRD beamline at INDUS 2 synchrotron radiation source. GIXRD shows the formation of mixture of FCCTiC{sub x}N{sub (1-x)} films for different values of x along with the solid solution. From the in-plane and out-of-plane XRD measurements, we have observed that a specific texture along the c-axis of Ti has been formed during the laser treatment process. Due to the diffusion of C and N into Ti, the resistance of the specimen has been decreases with respect to the resistance of pure Ti sheet. The formed phases are stable and there is no structural relaxation has been observed during annealing process.

• OSTI ID: 22490418
• Journal Information: AIP Conference Proceedings, Vol. 1665, Issue 1; Conference: 59. DAE solid state physics symposium 2014, Tamilnadu (India), 16-20 Dec 2014; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ANNEALING
DIFFUSION
FCC LATTICES
FILMS
GRAIN ORIENTATION
INDUS-2
LASER RADIATION
PHASE STABILITY
RELAXATION
SHEETS
SOLID SOLUTIONS
SYNCHROTRON RADIATION
TEXTURE
TITANIUM
TITANIUM CARBIDES
TITANIUM NITRIDES
X-RAY DIFFRACTION