High pressure Laue diffraction and its application to study microstructural changes during the α → β phase transition in Si

Journal Article · Wed Jul 15 04:00:00 EDT 2015 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.4926894· OSTI ID:22482692

Park, C.; Kenney-Benson, C.; Shen, G. ^[1]

---

1. High Pressure Collaborative Access Team, Geophysical Laboratory, Carnegie Institution of Washington, Argonne, Illinois 60439 (United States)

An approach using polychromatic x-ray Laue diffraction is described for studying pressure induced microstructural changes of materials under pressure. The advantages of this approach with respect to application of monochromatic x-ray diffraction and other techniques are discussed. Experiments to demonstrate the applications of the method have been performed on the α → β phase transition in Si at high pressures using a diamond anvil cell. We present the characterization of microstructures across the α–β phase transition, such as morphology of both the parent and product phases, relative orientation of single-crystals, and deviatoric strains. Subtle inhomogeneous strain of the single-crystal sample caused by lattice rotations becomes detectable with the approach.

• OSTI ID: 22482692
• Journal Information: Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 7 Vol. 86; ISSN 0034-6748; ISSN RSINAK
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
DIAMONDS
MATERIALS
MICROSTRUCTURE
MONOCHROMATIC RADIATION
MONOCRYSTALS
MORPHOLOGY
ORIENTATION
PHASE TRANSFORMATIONS
ROTATION
STRAINS
X RADIATION
X-RAY DIFFRACTION