Mechanisms of Pressure-Induced Phase Transitions by Real-Time Laue Diffraction

Popov, Dmitry; Velisavljevic, Nenad; Somayazulu, Maddury

doi:10.3390/cryst9120672

Mechanisms of Pressure-Induced Phase Transitions by Real-Time Laue Diffraction

Journal Article · Sat Dec 14 04:00:00 EST 2019 · Crystals

DOI:https://doi.org/10.3390/cryst9120672· OSTI ID:1581777

Popov, Dmitry ^[1]; Velisavljevic, Nenad ^[2]; Somayazulu, Maddury ^[1]

Argonne National Lab. (ANL), Argonne, IL (United States)
Argonne National Lab. (ANL), Argonne, IL (United States); Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)

Synchrotron X-ray radiation Laue diffraction is a widely used diagnostic technique for characterizing the microstructure of materials. An exciting feature of this technique is that comparable numbers of reflections can be measured several orders of magnitude faster than using monochromatic methods. This makes polychromatic beam diffraction a powerful tool for time-resolved microstructural studies, critical for understanding pressure-induced phase transition mechanisms, by in situ and in operando measurements. The current status of this technique, including experimental routines and data analysis, is presented along with some case studies. The new experimental setup at the High-Pressure Collaborative Access Team (HPCAT) facility at the Advanced Photon Source, specifically dedicated for in situ and in operando microstructural studies by Laue diffraction under high pressure, is presented.

View Accepted Manuscript (DOE)

Research Organization:: Argonne National Laboratory (ANL), Argonne, IL (United States)

Sponsoring Organization:: USDOE National Nuclear Security Administration (NNSA); USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22). Scientific User Facilities Division

Grant/Contract Number:: AC02-06CH11357; AC52-07NA27344

OSTI ID:: 1581777

Journal Information:: Crystals, Journal Name: Crystals Journal Issue: 12 Vol. 9; ISSN CRYSBC; ISSN 2073-4352

Publisher:: MDPICopyright Statement

Country of Publication:: United States

Language:: English

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