High pressure Laue diffraction and its application to study microstructural changes during the α → β phase transition in Si

Popov, D.; Park, C.; Kenney-Benson, C.; Shen, G.

doi:10.1063/1.4926894

High pressure Laue diffraction and its application to study microstructural changes during the α → β phase transition in Si

Journal Article · Mon Jul 20 00:00:00 EDT 2015 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.4926894· OSTI ID:1203736

^[1]; ^[1]; Kenney-Benson, C. ^[1]; Shen, G. ^[1]

Carnegie Inst. of Washington, Argonne, IL (United States). High Pressure Collaborative Access Team (HPCAT)

Here, an approach using polychromatic x-ray Laue diffraction is described for studying pressure induced microstructural changes of materials under pressure. The advantages of this approach with respect to application of monochromatic x-ray diffraction and other techniques are discussed. Experiments to demonstrate the applications of the method have been performed on the α → β phase transition in Si at high pressures using a diamond anvil cell. We present the characterization of microstructures across the α–β phase transition, such as morphology of both the parent and product phases, relative orientation of single-crystals, and deviatoric strains. Subtle inhomogeneous strain of the single-crystal sample caused by lattice rotations becomes detectable with the approach.

View Accepted Manuscript (DOE)

Research Organization:: Argonne National Laboratory (ANL), Argonne, IL (United States). Advanced Photon Source (APS)

Sponsoring Organization:: National Science Foundation (NSF); USDOE National Nuclear Security Administration (NNSA); USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: AC02-06CH11357; FG02-99ER45775; NA0001974

OSTI ID:: 1203736

Alternate ID(s):: OSTI ID: 1228683
OSTI ID: 22482692

Journal Information:: Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 7 Vol. 86; ISSN 0034-6748

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: ENGLISH

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Multimode scanning X-ray diffraction microscopy for diamond anvil cell experiments Hrubiak, Rostislav; Smith, Jesse S.; Shen, Guoyin Review of Scientific Instruments, Vol. 90, Issue 2 https://doi.org/10.1063/1.5057518	journal	February 2019
High-pressure studies with x-rays using diamond anvil cells Shen, Guoyin; Mao, Ho Kwang Reports on Progress in Physics, Vol. 80, Issue 1 https://doi.org/10.1088/1361-6633/80/1/016101	journal	November 2016

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High pressure Laue diffraction and its application to study microstructural changes during the α → β phase transition in Si

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