Paramagnetic to antiferromagnetic transition in epitaxial tetragonal CuMnAs (invited)

Journal Article · Thu May 07 04:00:00 EDT 2015 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.4914119· OSTI ID:22402968

Hills, V.; Campion, R. P.; Beardsley, R.; Edmonds, K. W.; Gallagher, B. L. ^[1]; Novak, V. ^[2]; Ouladdiaf, B. ^[3]; Jungwirth, T. ^[2]

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1. School of Physics and Astronomy, University of Nottingham, Nottingham NG7 2RD (United Kingdom)
2. Institute of Physics ASCR, v.v.i., Cukrovarnická 10, 162 53 Praha 6 (Czech Republic)
3. Institut Laue-Langevin, 6 Rue Jules Horowitz, 38042 Grenoble (France)

In this paper, we use neutron scattering and electrical transport to investigate the paramagnetic to antiferromagnetic phase transition in tetragonal CuMnAs films on GaP(001). X-ray diffraction and cross-sectional transmission electron microscopy measurements show that the films are chemically ordered with high structural quality. The temperature dependence of the structurally forbidden (100) neutron scattering peak is used to determine the Néel temperature, T{sub N}. We then demonstrate the presence of a clear peak in the temperature derivative of the resistivity around T{sub N}. The effect of disorder-induced broadening on the shape of the peak is discussed.

• OSTI ID: 22402968
• Journal Information: Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 17 Vol. 117; ISSN JAPIAU; ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ANTIFERROMAGNETISM
COPPER COMPOUNDS
EPITAXY
FILMS
GALLIUM PHOSPHIDES
MANGANESE ARSENIDES
NEUTRON DIFFRACTION
PARAMAGNETISM
PHASE TRANSFORMATIONS
TEMPERATURE DEPENDENCE
TRANSMISSION ELECTRON MICROSCOPY
X-RAY DIFFRACTION