Emerging edge states on the surface of the epitaxial semimetal CuMnAs thin film

Nguyen, Giang D.; Pitike, Krishna Chaitanya; Wadley, Peter; Cooper, Valentino R.; Yoon, Mina; Berlijn, Tom; Li, An-Ping

doi:10.1063/1.5130624

Emerging edge states on the surface of the epitaxial semimetal CuMnAs thin film

Journal Article · Mon Feb 10 00:00:00 EST 2020 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.5130624· OSTI ID:1607106

Nguyen, Giang D. ^[1]; ^[2]; Wadley, Peter ^[3]; ^[2]; ^[2]; Berlijn, Tom ^[2]; ^[2]

Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States); Univ. of British Columbia, Vancouver, BC (Canada)
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Univ. of Nottingham (United Kingdom)

Epitaxial thin films of CuMnAs have recently attracted attention due to their potential to host relativistic antiferromagnetic spintronics and exotic topological physics. Here, we report on the structural and electronic properties of a tetragonal CuMnAs thin film studied using scanning tunneling microscopy (STM) and density functional theory (DFT). STM reveals a surface terminated by As atoms, with the expected semi-metallic behavior. An unexpected zigzag step edge surface reconstruction is observed with emerging electronic states below the Fermi energy. DFT calculations indicate that the step edge reconstruction can be attributed to an As deficiency that results in changes in the density of states of the remaining As atoms at the step edge. Furthermore, this understanding of the surface structure and step edges on the CuMnAs thin film will enable in-depth studies of its topological properties and magnetism.

View Accepted Manuscript (DOE)

Research Organization:: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22). Materials Sciences & Engineering Division

Grant/Contract Number:: AC02-05CH11231; AC05-00OR22725

OSTI ID:: 1607106

Alternate ID(s):: OSTI ID: 1598910

Journal Information:: Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 6 Vol. 116; ISSN 0003-6951

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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