Antiferromagnetic transitions in `tetragonal-like' BiFeO3

Journal Article · Sun Jan 01 04:00:00 EST 2012 · Physical Review. B, Condensed Matter and Materials Physics

DOI:https://doi.org/10.1103/PhysRevB.85.100406· OSTI ID:1037024

MacDougall, Gregory J ^[1]; Christen, Hans M ^[1]; Siemons, Wolter ^[1]; Biegalski, Michael D ^[1]; Zarestky, Jerel L ^[1]; Liang, Shuhua ^[1]; Dagotto, Elbio R ^[1]; Nagler, Stephen E ^[1]

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1. ORNL

Recent studies have reported the existence of an epitaxially-stabilized tetragonal-like (`T-like') monoclinic phase in BiFeO3 thin-films with high levels of compressive strain. Though there is abundant evidence that structural and ferroelectric properties are di erent than in rhombohedral-like (`R-like') films with lower levels of strain, little information exists on magnetic properties. Here,we report a detailed neutron scattering study of a nearly phase-pure film of T-like BiFeO3. By tracking the temperature dependence and relative intensity of several superstructure peaks in the reciprocal lattice cell, we confirm antiferromagnetism with largely G-type character and T_N = 324 K. A minority magnetic phase with C-type character is also reported with T_N= 260 K. The co-existence of the two phases in T-like BiFeO3 and the difference in ordering temperatures between R-like and T-like systems is explained through simple Fe-O-Fe bond distance considerations.

• Research Organization: Oak Ridge National Laboratory (ORNL); Center for Nanophase Materials Sciences; High Flux Isotope Reactor
• Sponsoring Organization: SC USDOE - Office of Science (SC)
• DOE Contract Number: AC05-00OR22725
• OSTI ID: 1037024
• Journal Information: Physical Review. B, Condensed Matter and Materials Physics, Journal Name: Physical Review. B, Condensed Matter and Materials Physics Journal Issue: 10 Vol. 85; ISSN 1098-0121
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ANTIFERROMAGNETISM
BISMUTH COMPOUNDS
IRON OXIDES
MAGNETIC PROPERTIES
NEUTRON DIFFRACTION
SCATTERING
TEMPERATURE DEPENDENCE
THIN FILMS