Determination of effective mechanical properties of a double-layer beam by means of a nano-electromechanical transducer

Journal Article · Mon Sep 29 00:00:00 EDT 2014 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4896785· OSTI ID:22350813

Hocke, Fredrik; Pernpeintner, Matthias; Gross, Rudolf ^[1]; Zhou, Xiaoqing; Kippenberg, Tobias J. ^[2]; Schliesser, Albert ^[2]; Huebl, Hans ^[1]

---

1. Walther-Meißner-Institut, Bayerische Akademie der Wissenschaften, D-85748 Garching (Germany)
2. École Polytechnique Fédérale de Lausanne, CH-1015 Lausanne (Switzerland)

We investigate the mechanical properties of a doubly clamped, double-layer nanobeam embedded into an electromechanical system. The nanobeam consists of a highly pre-stressed silicon nitride and a superconducting niobium layer. By measuring the mechanical displacement spectral density both in the linear and the nonlinear Duffing regime, we determine the pre-stress and the effective Young's modulus of the nanobeam. An analytical double-layer model quantitatively corroborates the measured values. This suggests that this model can be used to design mechanical multilayer systems for electro- and optomechanical devices, including materials controllable by external parameters such as piezoelectric, magnetostrictive, or in more general multiferroic materials.

• OSTI ID: 22350813
• Journal Information: Applied Physics Letters, Vol. 105, Issue 13; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
77 NANOSCIENCE AND NANOTECHNOLOGY
BEAMS
EQUIPMENT
LAYERS
MAGNETOSTRICTION
NANOSTRUCTURES
NANOTECHNOLOGY
NIOBIUM
NONLINEAR PROBLEMS
PIEZOELECTRICITY
SILICON NITRIDES
SPECTRAL DENSITY
STRESSES
TRANSDUCERS
YOUNG MODULUS