Quantifying the Environmental Sensitivity of SSTDR Signals for Monitoring PV Strings
Journal Article
·
· IEEE Journal of Photovoltaics
- University of Florida, Gainesville, FL (United States); University of Florida
- University of Utah, Salt Lake City, UT (United States)
- University of Florida, Gainesville, FL (United States)
Current spread spectrum time-domain reflectometry (SSTDR) fault detection methods in photovoltaics compare measurements with a fault-free baselin.Yet, environmental factors, such as illuminance, temperature, and humidity, affect these signals and can negatively affect our ability to detect and locate faults. This article explains and quantifies the effects of environmental factors on SSTDR measurements. We demonstrate that illuminance, temperature, and humidity each significantly affect reflections from photovoltaic panels, which require the use of up to 240 baselines to prevent environmental variation from obscuring faults. Here, we present a method to determine the number of required baselines in any given climate and motivate future work in baseline prediction.
- Research Organization:
- University of Utah, Salt Lake City, UT (United States)
- Sponsoring Organization:
- USDOE Office of Energy Efficiency and Renewable Energy (EERE), Renewable Power Office. Solar Energy Technologies Office
- Grant/Contract Number:
- EE0008169
- OSTI ID:
- 2234307
- Alternate ID(s):
- OSTI ID: 1980416
- Journal Information:
- IEEE Journal of Photovoltaics, Journal Name: IEEE Journal of Photovoltaics Journal Issue: 1 Vol. 12; ISSN 2156-3381
- Publisher:
- IEEECopyright Statement
- Country of Publication:
- United States
- Language:
- English
Similar Records
A Model for SSTDR Signal Propagation Through Photovoltaic Strings
Quantifying the Window of Uncertainty for SSTDR Measurements of a Photovoltaic System
Journal Article
·
Sun Oct 04 20:00:00 EDT 2020
· IEEE Journal of Photovoltaics
·
OSTI ID:2234339
Quantifying the Window of Uncertainty for SSTDR Measurements of a Photovoltaic System
Journal Article
·
Thu Feb 11 19:00:00 EST 2021
· IEEE Sensors Journal
·
OSTI ID:2234337