Quantifying the Window of Uncertainty for SSTDR Measurements of a Photovoltaic System

Benoit, Evan; Mismash, Jack; Kingston, Samuel R.; Edun, Ayobami S.; Ellis, Hunter; LaFlamme, Cody; Scarpulla, Michael A.; Harley, Joel B.; Furse, Cynthia M.

doi:10.1109/jsen.2021.3059412

Quantifying the Window of Uncertainty for SSTDR Measurements of a Photovoltaic System

Journal Article · Fri Feb 12 00:00:00 EST 2021 · IEEE Sensors Journal

DOI:https://doi.org/10.1109/jsen.2021.3059412· OSTI ID:2234337

^[1]; ^[2]; Kingston, Samuel R. ^[2]; ^[3]; Ellis, Hunter ^[2]; ^[3]; ^[2]; ^[3]; ^[4]

Univ. of Utah, Salt Lake City, UT (United States); University of Utah
Univ. of Utah, Salt Lake City, UT (United States)
Univ. of Florida, Gainesville, FL (United States)
Univ. of Utah, Salt Lake City, UT (United States); LiveWire Test Labs, Inc., Salt Lake City, UT (United States)

Spread spectrum time domain reflectometry (SSTDR) is a non-intrusive method for electrical fault detection and localization that enables continuous monitoring of live electrical systems. Electrical faults create changes in impedance that create subsequent changes in the SSTDR reflection response. These changes in reflection response can be detected only if the changes are outside the window of uncertainty of the SSTDR measurement. In this paper, we establish a method of determining this window of uncertainty and the associated minimum-detectable change in impedance for SSTDR measurements. We demonstrate this for a photovoltaic (PV) systems, although the methods could be similarly applied to other applications. We assess the variability in SSTDR measurements caused by changes in the PV system that are representative of normal maintenance actions such as disconnecting/reconnecting a connector and completely breaking-down/setting-up the entire system. We evaluate how this variability translates to a minimum-detectable change in impedance and how that relates to common faults in PV systems (arc and ground faults, shading, damaged cells, and aging). Here we also describe methods of increasing SSTDR fidelity to accurately extract minor changes in impedance and therefore, detect small-magnitude electrical faults.

View Accepted Manuscript (DOE)

Research Organization:: Univ. of Utah, Salt Lake City, UT (United States)

Sponsoring Organization:: USDOE Office of Energy Efficiency and Renewable Energy (EERE), Renewable Power Office. Solar Energy Technologies Office

Contributing Organization:: University of Florida

Grant/Contract Number:: EE0008169

OSTI ID:: 2234337

Alternate ID(s):: OSTI ID: 1848698

Journal Information:: IEEE Sensors Journal, Journal Name: IEEE Sensors Journal Journal Issue: 8 Vol. 21; ISSN 1530-437X

Publisher:: IEEECopyright Statement

Country of Publication:: United States

Language:: English

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14 SOLAR ENERGY
complex impedance
fault detection
photovoltaic (PV)
reflectometry
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variability

Quantifying the Window of Uncertainty for SSTDR Measurements of a Photovoltaic System

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