Design of radiation resistant metallic multilayers for advanced nuclear systems

Zhernenkov, Mikhail; Gill, Simerjeet; Stanic, Vesna; DiMasi, Elaine; Kisslinger, Kim; Ecker, Lynne; Baldwin, J. Kevin; Misra, Amit; Demkowicz, M. J.

doi:10.1063/1.4883481

Design of radiation resistant metallic multilayers for advanced nuclear systems

Journal Article · Mon Jun 16 00:00:00 EDT 2014 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4883481· OSTI ID:22299885

Zhernenkov, Mikhail; Gill, Simerjeet; Stanic, Vesna; DiMasi, Elaine; Kisslinger, Kim; Ecker, Lynne ^[1]; Baldwin, J. Kevin; Misra, Amit ^[2]; Demkowicz, M. J. ^[3]

Brookhaven National Laboratory, Upton, New York 11973 (United States)
Los Alamos National Laboratory, Los Alamos, New Mexico 87545 (United States)
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139 (United States)

Helium implantation from transmutation reactions is a major cause of embrittlement and dimensional instability of structural components in nuclear energy systems. Development of novel materials with improved radiation resistance, which is of the utmost importance for progress in nuclear energy, requires guidelines to arrive at favorable parameters more efficiently. Here, we present a methodology that can be used for the design of radiation tolerant materials. We used synchrotron X-ray reflectivity to nondestructively study radiation effects at buried interfaces and measure swelling induced by He implantation in Cu/Nb multilayers. The results, supported by transmission electron microscopy, show a direct correlation between reduced swelling in nanoscale multilayers and increased interface area per unit volume, consistent with helium storage in Cu/Nb interfaces in forms that minimize dimensional changes. In addition, for Cu/Nb layers, a linear relationship is demonstrated between the measured depth-dependent swelling and implanted He density from simulations, making the reflectivity technique a powerful tool for heuristic material design.

OSTI ID:: 22299885

Journal Information:: Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 24 Vol. 104; ISSN APPLAB; ISSN 0003-6951

Country of Publication:: United States

Language:: English

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Helium Irradiation and Implantation Effects on the Structure of Amorphous Silicon Oxycarbide Su, Qing; Inoue, Shinsuke; Ishimaru, Manabu Scientific Reports, Vol. 7, Issue 1 https://doi.org/10.1038/s41598-017-04247-x	journal	June 2017

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Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
COPPER
CORRELATIONS
ELECTRIC CONDUCTIVITY
INSTABILITY
INTERFACES
LAYERS
NANOSTRUCTURES
NIOBIUM
NUCLEAR ENERGY
PHYSICAL RADIATION EFFECTS
REFLECTIVITY
SIMULATION
TRANSMISSION ELECTRON MICROSCOPY
TRANSMUTATION
X RADIATION

Design of radiation resistant metallic multilayers for advanced nuclear systems

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References (28)

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