A Transmission Electron Microscopy Study of the Effect of Interfaces on Bubble Formation in He-Implanted Cu-Nb Multilayers

Bhattacharyya, D.; Demkowicz, M. J.; Wang, Y. -Q.; Baumer, R. E.; Nastasi, M.; Misra, A.

doi:10.1017/S1431927611012219

A Transmission Electron Microscopy Study of the Effect of Interfaces on Bubble Formation in He-Implanted Cu-Nb Multilayers

Journal Article · Tue Jan 17 23:00:00 EST 2012 · Microscopy and Microanalysis

DOI:https://doi.org/10.1017/S1431927611012219· OSTI ID:1387016

Bhattacharyya, D.; Demkowicz, M. J.; Wang, Y. -Q.; Baumer, R. E.; Nastasi, M.; Misra, A.

Magnetron sputtered thin films of Cu, Nb, and Cu-Nb multilayers with 2.5 and 5 nm nominal layer thickness were deposited on Si and implanted with 4He+ and 3He+ ions. Secondary ion mass spectroscopy and nuclear reaction analysis, respectively, were used to measure the 4He+ and 3He+ concentration profile with depth inside the films. Cross-sectional transmission electron microscopy was used to characterize the helium bubbles. Analysis of the contrast from helium bubbles in defocused transmission electron microscope images showed a minimum bubble diameter of 1.25 nm. While pure Cu and Nb films showed bubble contrast over the entire range of helium implantation, the multilayers exhibited bubbles only above a critical He concentration that increased almost linearly with decreasing layer thickness. The work shows that large amounts of helium can be trapped at incoherent interfaces in the form of stable, nanometer-size bubbles.

Research Organization:: Energy Frontier Research Centers (EFRC) (United States). Center for Materials at Irradiation and Mechanical Extremes (CMIME)

Sponsoring Organization:: USDOE SC Office of Basic Energy Sciences (SC-22)

OSTI ID:: 1387016

Journal Information:: Microscopy and Microanalysis, Journal Name: Microscopy and Microanalysis Journal Issue: 01 Vol. 18; ISSN 1431-9276; ISSN applab

Publisher:: Microscopy Society of America (MSA)

Country of Publication:: United States

Language:: English

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A Transmission Electron Microscopy Study of the Effect of Interfaces on Bubble Formation in He-Implanted Cu-Nb Multilayers

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