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The effect of Ta doping in polycrystalline TiO{sub x} and the associated thin film transistor properties

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.4831783· OSTI ID:22254021
; ;  [1];  [2]
  1. Division of Materials Science and Engineering, Hanyang University, 222 Wangsimni-ro, Seongdong-gu, Seoul 133-791 (Korea, Republic of)
  2. Department of Physics, Dankook University, 119 Dandae-ro, Dongnam-gu, Cheonan 330-714 (Korea, Republic of)
Tantalum (Ta) is suggested to act as an electron donor and crystal phase stabilizer in titanium oxide (TiO{sub x}). A transition occurs from an amorphous state to a crystalline phase at an annealing temperature above 300 °C in a vacuum ambient. As the annealing temperature increases from 300 °C to 450 °C, the mobility increases drastically from 0.07 cm{sup 2}/Vs to 0.61 cm{sup 2}/Vs. The remarkable enhancement of thin film transistor performance is suggested to be due to the splitting of Ti 3d band orbitals as well as the increase in Ta{sup 5+} ions that can act as electron donors.
OSTI ID:
22254021
Journal Information:
Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 21 Vol. 103; ISSN APPLAB; ISSN 0003-6951
Country of Publication:
United States
Language:
English

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