A multi-crystal wavelength dispersive x-ray spectrometer
- LCLS, SLAC National Accelerator Laboratory, Menlo Park, California 94025 (United States)
- SSRL, SLAC National Accelerator Laboratory, Menlo Park, California 94025 (United States)
- Physical Biosciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720-8099 (United States)
A multi-crystal wavelength dispersive hard x-ray spectrometer with high-energy resolution and large solid angle collection is described. The instrument is specifically designed for time-resolved applications of x-ray emission spectroscopy (XES) and x-ray Raman scattering (XRS) at X-ray Free Electron Lasers (XFEL) and synchrotron radiation facilities. It also simplifies resonant inelastic x-ray scattering (RIXS) studies of the whole 2d RIXS plane. The spectrometer is based on the Von Hamos geometry. This dispersive setup enables an XES or XRS spectrum to be measured in a single-shot mode, overcoming the scanning needs of the Rowland circle spectrometers. In conjunction with the XFEL temporal profile and high-flux, it is a powerful tool for studying the dynamics of time-dependent systems. Photo-induced processes and fast catalytic reaction kinetics, ranging from femtoseconds to milliseconds, will be resolvable in a wide array of systems circumventing radiation damage.
- OSTI ID:
- 22093654
- Journal Information:
- Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 7 Vol. 83; ISSN 0034-6748; ISSN RSINAK
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
CRYSTALS
EMISSION SPECTRA
EMISSION SPECTROSCOPY
ENERGY RESOLUTION
FREE ELECTRON LASERS
HARD X RADIATION
RAMAN EFFECT
RAMAN SPECTROSCOPY
SOLIDS
SYNCHROTRON RADIATION
TIME DEPENDENCE
TIME RESOLUTION
WAVELENGTHS
X-RAY DIFFRACTION
X-RAY LASERS
X-RAY SPECTRA
X-RAY SPECTROMETERS