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X-ray spectrometer and methods for use

Patent ·
OSTI ID:1840233

A spectrometer includes a crystal analyzer having a radius of curvature that defines a Rowland circle, a sample stage configured to support a sample such that the sample is offset from the Rowland circle, an x-ray source configured to emit unfocused x-rays toward the sample stage, and a position-sensitive detector that is tangent to the Rowland circle. A method performed via a spectrometer includes emitting, via an x-ray source, unfocused x-rays toward a sample that is mounted on a sample stage such that the sample is offset from the Rowland Circle, thereby causing the sample to emit x-rays that impinge on the crystal analyzer or transmit a portion of the unfocused x-rays to impinge on the crystal analyzer; scattering, via the crystal analyzer, the x-rays that impinge on the crystal analyzer; and detecting the scattered x-rays via a position-sensitive detector that is tangent to the Rowland circle.

Research Organization:
Los Alamos National Laboratory (LANL), Los Alamos, NM (United States); University of Washington, Seattle, WA (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC52-06NA25396; SC0002194; SC0008580; SC0002194
Assignee:
UNIVERSITY OF WASHINGTON (Seattle, WA)
Patent Number(s):
11,054,375
Application Number:
16/333,405
OSTI ID:
1840233
Country of Publication:
United States
Language:
English

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