A von Hamos x-ray spectrometer based on a segmented-type diffraction crystal for single-shot x-ray emission spectroscopy and time-resolved resonant inelastic x-ray scattering studies

Journal Article · Mon Oct 15 00:00:00 EDT 2012 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.4756691· OSTI ID:22093773

Szlachetko, J. ^[1]; Nachtegaal, M.; Boni, E. de; Willimann, M.; Safonova, O.; Sa, J.; Smolentsev, G.; Szlachetko, M.; Bergamaschi, A.; Schmitt, B.; David, C.; Luecke, A. ^[1]; Bokhoven, J. A. van ^[1]; Dousse, J. -Cl.; Hoszowska, J.; Kayser, Y. ^[2]; Jagodzinski, P. ^[3]

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1. Paul Scherrer Institut, 5232 Villigen PSI (Switzerland)
2. Department of Physics, University of Fribourg, 1700 Fribourg (Switzerland)
3. University of Technology, Kielce (Poland)

We report on the design and performance of a wavelength-dispersive type spectrometer based on the von Hamos geometry. The spectrometer is equipped with a segmented-type crystal for x-ray diffraction and provides an energy resolution in the order of 0.25 eV and 1 eV over an energy range of 8000 eV-9600 eV. The use of a segmented crystal results in a simple and straightforward crystal preparation that allows to preserve the spectrometer resolution and spectrometer efficiency. Application of the spectrometer for time-resolved resonant inelastic x-ray scattering and single-shot x-ray emission spectroscopy is demonstrated.

• OSTI ID: 22093773
• Journal Information: Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 10 Vol. 83; ISSN 0034-6748; ISSN RSINAK
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CRYSTALLOGRAPHY
CRYSTALS
EFFICIENCY
EMISSION SPECTROSCOPY
ENERGY RESOLUTION
KEV RANGE 01-10
PERFORMANCE
TIME RESOLUTION
WAVELENGTHS
X RADIATION
X-RAY DIFFRACTION
X-RAY SPECTROMETERS
X-RAY SPECTROSCOPY