Single-qubit-gate error below 10{sup -4} in a trapped ion

Journal Article · Thu Sep 15 04:00:00 EDT 2011 · Physical Review. A

DOI:https://doi.org/10.1103/PHYSREVA.84.030303· OSTI ID:22068607

Brown, K R; Wilson, A C; Colombe, Y; Ospelkaus, C; Meier, A M; Knill, E; Leibfried, D; Wineland, D J ^[1]

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1. National Institute of Standards and Technology, 325 Broadway, Boulder, Colorado 80305 (United States)

With a {sup 9}Be{sup +} trapped-ion hyperfine-state qubit, we demonstrate an error probability per randomized single-qubit gate of 2.0(2)x10{sup -5}, below the threshold estimate of 10{sup -4} commonly considered sufficient for fault-tolerant quantum computing. The {sup 9}Be{sup +} ion is trapped above a microfabricated surface-electrode ion trap and is manipulated with microwaves applied to a trap electrode. The achievement of low single-qubit-gate errors is an essential step toward the construction of a scalable quantum computer.

• OSTI ID: 22068607
• Journal Information: Physical Review. A, Journal Name: Physical Review. A Journal Issue: 3 Vol. 84; ISSN 1050-2947; ISSN PLRAAN
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
74 ATOMIC AND MOLECULAR PHYSICS
BERYLLIUM 9
ELECTRODES
ERRORS
IONS
MICROWAVE RADIATION
PROBABILITY
QUANTUM COMPUTERS
SURFACES
TRAPPING
TRAPS