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Title: Technology for On-Chip Qubit Control with Microfabricated Surface Ion Traps

Technical Report ·
DOI:https://doi.org/10.2172/1326002· OSTI ID:1326002
 [1];  [2];  [2];  [3];  [3];  [3];  [3];  [4];  [5]
  1. Sandia National Lab. (SNL-NM), Albuquerque, NM (United States). Quantum Information Sciences Dept.
  2. Sandia National Lab. (SNL-NM), Albuquerque, NM (United States). RF/Optoelectronics Dept.
  3. Sandia National Lab. (SNL-NM), Albuquerque, NM (United States). Photonic Microsystem Technologies Dept.
  4. Sandia National Lab. (SNL-NM), Albuquerque, NM (United States). Microsystems Integration Dept.
  5. Sandia National Lab. (SNL-NM), Albuquerque, NM (United States). MESAFab Operations 2 Dept.

Trapped atomic ions are a leading physical system for quantum information processing. However, scalability and operational fidelity remain limiting technical issues often associated with optical qubit control. One promising approach is to develop on-chip microwave electronic control of ion qubits based on the atomic hyperfine interaction. This project developed expertise and capabilities at Sandia toward on-chip electronic qubit control in a scalable architecture. The project developed a foundation of laboratory capabilities, including trapping the 171Yb+ hyperfine ion qubit and developing an experimental microwave coherent control capability. Additionally, the project investigated the integration of microwave device elements with surface ion traps utilizing Sandia’s state-of-the-art MEMS microfabrication processing. This effort culminated in a device design for a multi-purpose ion trap experimental platform for investigating on-chip microwave qubit control, laying the groundwork for further funded R&D to develop on-chip microwave qubit control in an architecture that is suitable to engineering development.

Research Organization:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
DOE Contract Number:
AC04-94AL85000
OSTI ID:
1326002
Report Number(s):
SAND2013-9513; 495657
Country of Publication:
United States
Language:
English

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