High resolution extreme ultraviolet spectrometer for an electron beam ion trap

Journal Article · Mon Aug 15 00:00:00 EDT 2011 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.3618686· OSTI ID:22063695

Ohashi, Hayato; Yatsurugi, Junji; Nakamura, Nobuyuki ^[1]; Sakaue, Hiroyuki A ^[2]

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1. Institute for Laser Science, University of Electro-Communications, Chofu, Tokyo 182-8585 (Japan)
2. National Institute for Fusion Science, Toki, Gifu 509-5292 (Japan)

An extreme ultraviolet spectrometer has been developed for spectroscopic studies of highly charged ions with an electron beam ion trap. It has a slit-less configuration with a spherical varied-line-spacing grating that provides a flat focal plane for grazing incidence light. Alternative use of two different gratings enables us to cover the wavelength range 1-25 nm. Test observations with the Tokyo electron beam ion trap demonstrate the high performance of the present spectrometer such as a resolving power of above 1000.

• OSTI ID: 22063695
• Journal Information: Review of Scientific Instruments, Vol. 82, Issue 8; Other Information: (c) 2011 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
DIFFRACTION GRATINGS
ELECTRON BEAMS
EXTREME ULTRAVIOLET RADIATION
GRATINGS
INCIDENCE ANGLE
ION BEAMS
IONS
PERFORMANCE
RESOLUTION
SPHERICAL CONFIGURATION
TRAPS
ULTRAVIOLET SPECTROMETERS
VISIBLE RADIATION
WAVELENGTHS