Flat-field grating spectrometer for high-resolution soft x-ray and extreme ultraviolet measurements on an electron beam ion trap

Journal Article · Fri Oct 01 00:00:00 EDT 2004 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.1779609· OSTI ID:20636733

Beiersdorfer, P; Magee, E W; Traebert, E; Chen, H; Lepson, J K; Gu, M -F; Schmidt, M ^[1]

---

1. Lawrence Livermore National Laboratory, Livermore, California 94550 (United States)

A R=44.3 m grazing-incidence grating spectrometer has been implemented on the Livermore electron beam ion traps for high-resolution measurements in the soft x-ray and extreme ultraviolet region spanning from below 10 up to 50 A. The instrument uses a grating with variable line spacing (about 2400 l/mm for a flat field of view. Spectra are recorded with a back-illuminated charge-coupled device detector. The new instrument greatly improves upon the resolution achieved with existing grating spectrometers and complements crystal spectrometers at the shorter wavelengths both in terms of wavelength coverage and polarization independent reflectivity response.

• OSTI ID: 20636733
• Journal Information: Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 10 Vol. 75; ISSN 0034-6748; ISSN RSINAK
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CHARGE-COUPLED DEVICES
CRYSTALS
DIFFRACTION GRATINGS
ELECTRON BEAMS
EXTREME ULTRAVIOLET RADIATION
GRATINGS
OPTICS
POLARIZATION
REFLECTIVITY
SOFT X RADIATION
SPATIAL RESOLUTION
TRAPS
X-RAY SPECTROMETERS