High energy x-ray diffraction/x-ray fluorescence spectroscopy for high-throughput analysis of composition spread thin films

Journal Article · Tue Dec 15 04:00:00 EST 2009 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.3274179· OSTI ID:22051123

Gregoire, John M ^[1]; Dale, Darren; Kazimirov, Alexander ^[2]; DiSalvo, Francis J ^[3]; Dover, R Bruce van ^[4]

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1. Department of Physics, and Cornell Fuel Cell Institute, Cornell University, Ithaca, New York 14853 (United States)
2. Cornell High Energy Synchrotron Source, Cornell University, New York 14853 (United States)
3. Department of Chemistry and Chemical Biology, and Cornell Fuel Cell Institute, Cornell University, New York 14853 (United States)
4. Department of Materials Science and Engineering, and Cornell Fuel Cell Institute, Cornell University, New York 14853 (United States)

High-throughput crystallography is an important tool in materials research, particularly for the rapid assessment of structure-property relationships. We present a technique for simultaneous acquisition of diffraction images and fluorescence spectra on a continuous composition spread thin film using a 60 keV x-ray source. Subsequent noninteractive data processing provides maps of the diffraction profiles, thin film fiber texture, and composition. Even for highly textured films, our diffraction technique provides detection of diffraction from each family of Bragg reflections, which affords direct comparison of the measured profiles with powder patterns of known phases. These techniques are important for high throughput combinatorial studies as they provide structure and composition maps which may be correlated with performance trends within an inorganic library.

• OSTI ID: 22051123
• Journal Information: Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 12 Vol. 80; ISSN 0034-6748; ISSN RSINAK
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
BRAGG REFLECTION
COMPARATIVE EVALUATIONS
CRYSTAL STRUCTURE
DATA PROCESSING
DIFFRACTION GRATINGS
FLUORESCENCE SPECTROSCOPY
IMAGE PROCESSING
KEV RANGE
POWDERS
TEXTURE
THIN FILMS
X-RAY DIFFRACTION
X-RAY FLUORESCENCE ANALYSIS