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A high-current and high-temperature 6H-SiC thyristor

Journal Article · · IEEE Electron Device Letters
DOI:https://doi.org/10.1109/55.485194· OSTI ID:218520
; ;  [1]; ; ; ;  [2]
  1. Rutgers Univ., Piscataway, NJ (United States). Dept. of Electrical and Computer Engineering
  2. Army Research Lab., Fort Monmouth, NJ (United States). Physical Sciences Directorate

A 6H-SiC thyristor has been fabricated and characterized A forward breakover voltage close to 100 V and a pulse switched current density of 5,200 A/cm{sup 2} have been demonstrated. The thyristor is shown to operate under pulse gate triggering for turn-on and turn-off, with a rise time of 43 ns and a fall time of less than 100 ns. The forward breakover voltage is found to decrease by only 4% when the operating temperature is increased from room temperature to 300 C. It is found that anode ohmic contact resistance dominates the device forward drop at high current densities.

OSTI ID:
218520
Journal Information:
IEEE Electron Device Letters, Journal Name: IEEE Electron Device Letters Journal Issue: 3 Vol. 17; ISSN 0741-3106; ISSN EDLEDZ
Country of Publication:
United States
Language:
English

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