Non-Ideal p-n junction Diode of Sb{sub x}Se{sub 1-x}(x = 0.4, 0.5, 0.6, 0.7) Thin Films
Journal Article
·
· AIP Conference Proceedings
- Solar Energy Research Center, Renewable Energy Directorate, Ministry of Science and Technology, Baghdad (Iraq)
- Department of Physics, Panjab University, Chandigarh -160014 (India)
We have made diodes consisting of the same alloy i.e. Sb{sub x}Se{sub 1-x}(x = 0.4, 0.5, 0.6 and 0.7), but change the concentration of Sb metal from 40% to 70% atomic weight percentage. It is observed from the Hall measurements that the nature of charge carriers have changed from p- to n-type at x = 0.6 for Sb{sub x}Se{sub 1-x}. We have measured I-V characteristics of four p-n junction diodes i.e. p-Sb{sub 2}Se{sub 3}/n-Sb{sub 3}Se{sub 2}, p-Sb{sub 2}Se{sub 3}/n-Sb{sub 7}Se{sub 3}, p-SbSe/n-Sb{sub 3}Se{sub 2}, p-SbSe/n-Sb{sub 7}Se{sub 3}. From the I-V plots we have calculated the parameters as built-in voltage (V{sub bi}), forward resistance (R{sub f}), ideal factor (n), saturation current (I{sub o}), breakdown current (I{sub Bd}) and breakdown voltage (V{sub Bd}).
- OSTI ID:
- 21612364
- Journal Information:
- AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 1393; ISSN 0094-243X; ISSN APCPCS
- Country of Publication:
- United States
- Language:
- English
Similar Records
Laser Ablation Generation of Antimony Selenide Clusters: Laser Desorption Ionization (LDI) Quadrupole Ion Trap Time of Flight Mass Spectrometry
Al composition dependence of breakdown voltage in Al{sub x}Ga{sub 1-x}N Schottky rectifiers
A Near Ideal Edge Termination Technique for 4500V 4H-SiC Devices: The Hybrid Junction Termination Extension
Journal Article
·
Fri Apr 19 00:00:00 EDT 2019
· Journal of the American Society for Mass Spectrometry
·
OSTI ID:22923043
Al composition dependence of breakdown voltage in Al{sub x}Ga{sub 1-x}N Schottky rectifiers
Journal Article
·
Sun Mar 26 23:00:00 EST 2000
· Applied Physics Letters
·
OSTI ID:20215698
A Near Ideal Edge Termination Technique for 4500V 4H-SiC Devices: The Hybrid Junction Termination Extension
Journal Article
·
Sun Oct 30 20:00:00 EDT 2016
· IEEE Electron Device Letters
·
OSTI ID:2440205
Related Subjects
36 MATERIALS SCIENCE
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ANTIMONY COMPOUNDS
ANTIMONY SELENIDES
BREAKDOWN
CHALCOGENIDES
CHARGE CARRIERS
CONCENTRATION RATIO
CURRENTS
DIMENSIONLESS NUMBERS
ELECTRIC CONDUCTIVITY
ELECTRIC CURRENTS
ELECTRIC POTENTIAL
ELECTRICAL PROPERTIES
FILMS
HALL EFFECT
MAGNETIC MATERIALS
MATERIALS
N-TYPE CONDUCTORS
P-N JUNCTIONS
P-TYPE CONDUCTORS
PHYSICAL PROPERTIES
SELENIDES
SELENIUM COMPOUNDS
SEMICONDUCTOR JUNCTIONS
SEMICONDUCTOR MATERIALS
THIN FILMS
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ANTIMONY COMPOUNDS
ANTIMONY SELENIDES
BREAKDOWN
CHALCOGENIDES
CHARGE CARRIERS
CONCENTRATION RATIO
CURRENTS
DIMENSIONLESS NUMBERS
ELECTRIC CONDUCTIVITY
ELECTRIC CURRENTS
ELECTRIC POTENTIAL
ELECTRICAL PROPERTIES
FILMS
HALL EFFECT
MAGNETIC MATERIALS
MATERIALS
N-TYPE CONDUCTORS
P-N JUNCTIONS
P-TYPE CONDUCTORS
PHYSICAL PROPERTIES
SELENIDES
SELENIUM COMPOUNDS
SEMICONDUCTOR JUNCTIONS
SEMICONDUCTOR MATERIALS
THIN FILMS