Determination of the Poisson ratio of (001) and (111) oriented thin films of In{sub 2}O{sub 3} by synchrotron-based x-ray diffraction

Journal Article · Thu Dec 15 00:00:00 EST 2011 · Physical Review. B, Condensed Matter and Materials Physics

DOI:https://doi.org/10.1103/PHYSREVB.84.233301· OSTI ID:21596939

Zhang, K H. L.; Regoutz, A; Palgrave, R G; Payne, D J; Egdell, R G; Walsh, A; Collins, S P; Wermeille, D; Cowley, R A ^[1]

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1. Department of Chemistry, Inorganic Chemistry Laboratory, University of Oxford, South Parks Road, Oxford OX1 3QR (United Kingdom)

The Poisson ratio {nu} of In{sub 2}O{sub 3} has been determined by measurement of the covariation of in-plane and out-of-plane lattice parameters of strained thin films grown epitaxially on (111) and (001) oriented cubic Y-stabilized ZrO{sub 2} substrates. The experimental results are in good agreement with values for {nu} calculated using atomistic simulation procedures.

• OSTI ID: 21596939
• Journal Information: Physical Review. B, Condensed Matter and Materials Physics, Vol. 84, Issue 23; Other Information: DOI: 10.1103/PhysRevB.84.233301; (c) 2011 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 1098-0121
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
EPITAXY
INDIUM OXIDES
LATTICE PARAMETERS
POISSON RATIO
SIMULATION
SUBSTRATES
THIN FILMS
X-RAY DIFFRACTION
ZIRCONIUM OXIDES
CHALCOGENIDES
COHERENT SCATTERING
CRYSTAL GROWTH METHODS
DIFFRACTION
DIMENSIONLESS NUMBERS
FILMS
INDIUM COMPOUNDS
MECHANICAL PROPERTIES
OXIDES
OXYGEN COMPOUNDS
SCATTERING
TRANSITION ELEMENT COMPOUNDS
ZIRCONIUM COMPOUNDS