Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Abnormal humidity-dependent electrical properties of amorphous carbon/silicon heterojunctions

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.3520493· OSTI ID:21518181
; ; ; ; ;  [1]
  1. Department of Materials Science and Engineering, Laboratory of Advanced Materials, Tsinghua University, Beijing 100084 (China) and National Center for Electron Microscopy (Beijing), Tsinghua University, Beijing 100084 (China)
Amorphous carbon (a-C) film/n-Si heterojunctions have been fabricated by pulse laser deposition, and their current-voltage characteristics have been investigated. The results show that the atmosphere relative humidity (RH) has a significant effect on the reverse bias I-V characteristics of the heterojunctions. For the low bias voltages, the resistance of the a-C/Si heterojunction decreases with the increase of the RH. However, when the applied voltage is greater than a threshold, the resistance of the a-C/Si heterojunctions increases with the increase of the RH. This humidity-dependent phenomenon is attributed to the charge transfer from the absorbed H{sub 2}O molecular to a-C film.
OSTI ID:
21518181
Journal Information:
Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 21 Vol. 97; ISSN APPLAB; ISSN 0003-6951
Country of Publication:
United States
Language:
English