Characteristics of ZnO Wafers Implanted with 60 keV Sn{sup +} Ions at Room Temperature and at 110 K

Journal Article · Fri Jan 07 04:00:00 EST 2011 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.3548372· OSTI ID:21510103

Dang, Giang T; Taniwaki, Masafumi ^[1]; Kawaharamura, Toshiyuki; Hirao, Takashi ^[2]; Nitta, Noriko ^[3]

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1. Department of Environmental Systems Engineering, Kochi University of Technology, Kami, Kochi 782-8502 (Japan)
2. Research Institute for Nano-devices, Kochi University of Technology, Kami, Kochi 782-8502 (Japan)
3. Department of Mechanical Engineering, Kobe University, Rokkodai, Nada, Kobe 657-8501 (Japan)

ZnO wafers implanted with 60 keV Sn{sup +} ions at room temperature (RT) and at 110 K are investigated by means of X-ray diffraction (XRD) and photoluminescence (PL) techniques. The effect of implantation temperature is evident in the XRD and PL data. A yellow-orange (YO) band near 600 nm appears in the PL spectra of the ZnO wafers implanted to the doses of 4x10{sup 14} and 8x10{sup 14} ions/cm{sup 2} at RT. The intensity of this band increases and the peak position blue-shifts after illumination of the samples with the 325 nm line of a He-Cd laser. The PL data suggests that the CB (conduction band){yields}V{sub O}{sup +} and Zn{sub i}{sup +{yields}}V{sub Zn}{sup -} transitions contribute to the photoemission of the YO band.

• OSTI ID: 21510103
• Journal Information: AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 1321; ISSN APCPCS; ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
CHALCOGENIDES
CHARGED PARTICLES
COHERENT SCATTERING
DIFFRACTION
ELECTROMAGNETIC RADIATION
EMISSION
ENERGY RANGE
ILLUMINANCE
ION IMPLANTATION
IONS
KEV RANGE
KEV RANGE 10-100
LASER RADIATION
LUMINESCENCE
OXIDES
OXYGEN COMPOUNDS
PHOTOEMISSION
PHOTOLUMINESCENCE
PHOTON EMISSION
RADIATIONS
SCATTERING
SECONDARY EMISSION
SPECTRA
TEMPERATURE DEPENDENCE
TEMPERATURE RANGE
TEMPERATURE RANGE 0065-0273 K
TEMPERATURE RANGE 0273-0400 K
TIN IONS
X-RAY DIFFRACTION
ZINC COMPOUNDS
ZINC OXIDES