Correlating the structural, chemical, and optical properties at nanometer resolution

Journal Article · Thu Jan 14 23:00:00 EST 2010 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.3275048· OSTI ID:21476076

Gu, L; Oezdoel, V B; Sigle, W; Koch, C T; Srot, V; Aken, P A. van ^[1]

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1. Max-Planck Institute for Metals Research, Heisenbergstrasse 3, 70569 Stuttgart (Germany)

Valence electron spectroscopic imaging (VESI) techniques, taking advantages of the energy-losses suffered by inelastic scattering of the fast electrons in the transmission electron microscope, offer an inherently high spatial resolution to characterize the electronic structure of materials close to the Fermi level. Here we demonstrate that the combination of an electron monochromator and a highly dispersive imaging energy filter, which has become available only recently, allows reliable measurements of local bandgaps on the nanometer scale. In addition, the correlations of structural, chemical, and optical properties can be revealed via VESI using monochromated electrons with a high spatial resolution.

• OSTI ID: 21476076
• Journal Information: Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 1 Vol. 107; ISSN JAPIAU; ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
CORRELATIONS
ELECTRON MICROSCOPY
ELECTRON SPECTROSCOPY
ELECTRONIC STRUCTURE
ELECTRONS
ELEMENTARY PARTICLES
ENERGY GAP
ENERGY LEVELS
FERMI LEVEL
FERMIONS
INELASTIC SCATTERING
LEPTONS
MICROSCOPY
NANOSTRUCTURES
OPTICAL PROPERTIES
PHYSICAL PROPERTIES
RESOLUTION
SCATTERING
SOLIDS
SPATIAL RESOLUTION
SPECTROSCOPY
TRANSMISSION ELECTRON MICROSCOPY
VALENCE