Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Electrical properties of Zinc-Tin diarsenide (ZnSnAs{sub 2}) irradiated with H{sup +} ions

Journal Article · · Semiconductors
 [1]
  1. Tomsk State University (Russian Federation)

The results of studying the electrical properties and isochronous annealing of p-ZnSnAs{sub 2} irradiated with H{sup +} ions (energy E = 5 MeV, dose D = 2 x 10{sup 16} cm{sup -2}) are reported. The limiting electrical characteristics of irradiated material (the Hall coefficient R{sub H} (D){sub lim} {approx} -4 x 10{sup 3} cm{sup 3} C{sup -1}, conductivity {sigma} (D){sub lim} {approx} 2.9 x 10{sup -2} {omega}{sup -1} cm{sup -1}, and the Fermi level position F{sub lim} {approx} 0.58 eV above the valence-band top at 300 K) are determined. The energy position of the 'neutral' point for the ZnSnAs{sub 2} compound is calculated.

OSTI ID:
21260393
Journal Information:
Semiconductors, Journal Name: Semiconductors Journal Issue: 4 Vol. 43; ISSN SMICES; ISSN 1063-7826
Country of Publication:
United States
Language:
English

Similar Records

Electrical properties of proton-irradiated CdSnAs{sub 2}
Journal Article · Mon Jan 14 23:00:00 EST 2008 · Semiconductors · OSTI ID:21087943

Electrical properties of proton-irradiated CdSnAs{sub 2}
Journal Article · Mon Jan 14 23:00:00 EST 2008 · Semiconductors · OSTI ID:22004945

Properties of tin doped indium oxide thin films prepared by magnetron sputtering
Journal Article · Wed Jun 01 00:00:00 EDT 1983 · J. Appl. Phys.; (United States) · OSTI ID:5931278