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Arsenic doped zinc oxide

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.2917403· OSTI ID:21137352
; ; ; ; ;  [1]; ;  [2]
  1. Physics Institute, Justus-Liebig-Universitaet Giessen, Heinrich-Buff-Ring 16, 35392 Giessen (Germany)
  2. Institute for Ion Beam Physics and Materials Research, Forschungszentrum Dresden-Rossendorf, P.O. Box 51 01 19, D-01314 Dresden (Germany)

As-doping of zinc oxide has been approached by ion implantation and chemical vapor deposition. The effect of thermal annealing on the implanted samples has been investigated by using secondary ion mass spectrometry and Rutherford backscattering/channeling geometry. The crystal damage, the distribution of the arsenic, the diffusion of impurities, and the formation of secondary phases is discussed. For the thin films grown by vapor deposition, the composition has been determined with regard to the growth parameters. The bonding state of arsenic was investigated for both series of samples using x-ray photoelectron spectroscopy.

OSTI ID:
21137352
Journal Information:
Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 12 Vol. 103; ISSN JAPIAU; ISSN 0021-8979
Country of Publication:
United States
Language:
English