Strongly exhanced secondary ion yields in TOF-SIMS studies with very highly charged primary ions up to Th{sup 71+}

Conference · Sun Dec 31 04:00:00 EST 1995

OSTI ID:210741

Schenkel, T; Briere, M A; Schach van Wittenau, A E; Schneider, D ^[1]

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1. Lawrence Livermore National Lab., CA (United States)

The advent of new ion source technologies, such as the LLNL EBIT (Electron Beam Ion Trap), has made low emittance ({approximately}0.2 {pi} mm mrad) beams of slow (several keV/amu) very highly charged ions (up to U{sup 92+}) accessible for ion solid interaction studies. The prominent feature in the interaction of highly charged ions with surfaces, compared to conventional singly charged ions, is a dominance of electronic over collisional effects. Up to several hundreds of electrons (for Th{sup 70+} on Au{sup 2}) are emitted from an area of a few square nanometers per incident ion. In insulators, this local disturbance of the charge equilibrium produces a {open_quotes}Coulomb explosion{close_quotes}, resulting in the emission of large numbers of secondary particles, and the production of nanometer size defects.

• OSTI ID: 210741
• Report Number(s): CONF-9505261--
• Country of Publication: United States
• Language: English

Related Subjects

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