Modeling the ion-source performance of an electron-beam ion trap (invited)

Journal Article · Wed Apr 01 04:00:00 EST 1992 · Review of Scientific Instruments; (United States)

DOI:https://doi.org/10.1063/1.1142812· OSTI ID:7206716

Penetrante, B M; Schneider, D; Marrs, R E; Bardsley, J N ^[1]

---

1. High-Temperature Physics Division, Lawrence Livermore National Laboratory, Livermore, California 94550 (United States)

Several key features of the electron-beam ion trap (EBIT) enable it to provide superior ion-source performance for many applications requiring ultra-high-charged ions. This paper briefly reviews these features and the operating conditions in the existing EBITs. The present performance of the EBIT as an ion source is demonstrated by producing and extracting ions up to Th{sup 80+} and U{sup 70+} at microsecond-wide ion beam pulses of about 10{sup 4} ions per second. Using as examples the production of U{sup 92+}, U{sup 90+}, and Dy{sup 66+}, modeling results are presented to show how the fundamental processes limit the quality and quantity of ions that can be obtained from an upscaled EBIT.

• DOE Contract Number: W-7405-ENG-48
• OSTI ID: 7206716
• Journal Information: Review of Scientific Instruments; (United States), Journal Name: Review of Scientific Instruments; (United States) Vol. 63:4; ISSN RSINA; ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
430301* -- Particle Accelerators-- Ion Sources
BEAMS
CHARGED PARTICLES
DESIGN
DYSPROSIUM IONS
ELECTRON BEAMS
ION SOURCES
IONS
LEPTON BEAMS
OPERATION
PARTICLE BEAMS
PERFORMANCE
THORIUM IONS
TRAPPING
URANIUM IONS