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Analytical Applications Of Particle-Induced X-Ray Emission (PIXE)

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.2733279· OSTI ID:21057196
; ; ;  [1];  [2];  [3];  [4]
  1. 'Valahia' University of Targoviste, Targoviste (Romania)
  2. 'Dunarea de Jos' University of Galati, Galati (Romania)
  3. 'Horia Hulubei' NIPNE, Bucharest (Romania)
  4. 'Ovidius' University of Constanta, Constanta (Romania)

In this paper a complex study of the capabilities of Particle-Induced X-ray Emission (PIXE) technique for the determination of major, minor and trace constituents of metallurgical, biological and environmental samples has been done. The elements identified in the metallurgical samples (steels) using PIXE were: K, Ca, V, Cr, Mn, Fe, Co, Cu, Ni, Zn, W, Ga, As, Pb, Mo, Rb, In, Rh, Zr, Pd, Nb, Sn and Sb. In the investigated biological and environmental samples (vegetals leaves, soil and mosses) PIXE analysis allowed determination of: S, Cl, K, Ca, Ti, Mn, Fe, Ni, Cu, Zn, As, Hg and Pb.

OSTI ID:
21057196
Journal Information:
AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 899; ISSN 0094-243X; ISSN APCPCS
Country of Publication:
United States
Language:
English

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