A cryogenic Quadraprobe scanning tunneling microscope system with fabrication capability for nanotransport research

Journal Article · Sat Dec 15 04:00:00 EST 2007 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.2821610· OSTI ID:21024683

Kim, T -H; Zhouhang, Wang; Wendelken, John F; Weitering, Hanno H; Wenzhi, Li; Anping, Li ^[1]

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1. Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831 (United States)

We describe the development and the capabilities of an advanced system for nanoscale electrical transport studies. This system consists of a low temperature four-probe scanning tunneling microscope (STM) and a high-resolution scanning electron microscope coupled to a molecular-beam epitaxy sample preparation chamber. The four STM probes can be manipulated independently with subnanometer precision, enabling atomic resolution STM imaging and four-point electrical transport study of surface electronic systems and nanostructured materials at temperatures down to 10 K. Additionally, an integrated energy analyzer allows for scanning Auger microscopy to probe chemical species of nanostructures. Some testing results are presented.

• OSTI ID: 21024683
• Journal Information: Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 12 Vol. 78; ISSN 0034-6748; ISSN RSINAK
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ACCURACY
CRYOGENICS
ELECTRIC CONDUCTIVITY
FABRICATION
IMAGES
MOLECULAR BEAM EPITAXY
NANOSTRUCTURES
PROBES
RESOLUTION
SAMPLE PREPARATION
SCANNING ELECTRON MICROSCOPY
SCANNING TUNNELING MICROSCOPY
SURFACES
TEMPERATURE RANGE 0065-0273 K
TESTING